Zobrazeno 1 - 10
of 165
pro vyhledávání: '"K. Lilja"'
Autor:
K Lilja
Publikováno v:
IOP Conference Series: Earth and Environmental Science. 1122:012067
The goal of this research was to find out, what kind of further training an experienced electrician or electrical contractor needs to be able to design and implement a 12volts off grid system for residential use. In Finland, installing the low voltag
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::345b634fc44d0f17f308dad791a25cb8
https://doi.org/10.1088/1755-1315/1122/1/012067
https://doi.org/10.1088/1755-1315/1122/1/012067
Publikováno v:
Food and Nutrition Bulletin. 40:326-339
Background: Sorghum-Soy Blend (SSB) and Sorghum-Cowpea Blend (SCB) fortified blended food aid porridge products were developed as alternatives to Corn-Soy Blend Plus (CSB+) and Super Cereal Plus (SC+), the most widely used fortified blended food aid
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::73b2453afbe8562d9c3b7621e80eb887
https://doi.org/10.1177/0379572119846331
https://doi.org/10.1177/0379572119846331
Akademický článek
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Autor:
Rui Liu, R. Fung, Sanghyeon Baeg, K. Lilja, Rick Wong, Jeffrey S. Kauppila, Yuanqing Li, M. Newton, Haibin Wang, M. Bounasser, Bharat L. Bhuva, L. Chen, Lloyd W. Massengill, S.-J. Wen
Publikováno v:
IEEE Transactions on Nuclear Science. 64:367-373
In this paper, a variety of flip-flop (FF) designs fabricated in a commercial 28-nm Fully-Depleted Silicon on Insulator (FDSOI) technology are evaluated for their single-event upset performance with ions and pulsed laser experiments. These FF designs
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::adac103af083cb8a9fdaa034772a1b12
https://doi.org/10.1109/tns.2016.2630022
https://doi.org/10.1109/tns.2016.2630022
Autor:
Rick Wong, R. Fung, Sanghyeon Baeg, K. Lilja, Jeffrey S. Kauppila, Haibin Wang, Bharat L. Bhuva, Rui Liu, L. Chen, S.-J. Wen, Yuanqing Li
Publikováno v:
IEEE Transactions on Nuclear Science. 63:3003-3009
In this paper, we present D flip-flop, Quatro, and stacked Quarto flip-flop designs fabricated in a commercial 28-nm CMOS FDSOI technology. Stacked-transistor structures are introduced in the stacked Quatro design to protect the sensitive devices of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0a3ea8a192735bf9a49e221f80255251
https://doi.org/10.1109/tns.2016.2627003
https://doi.org/10.1109/tns.2016.2627003
Autor:
Rui Liu, Rick Wong, Bharat L. Bhuva, M. Newton, L. Chen, R. Fung, Sanghyeon Baeg, S.-J. Wen, Yuanqing Li, Mo Chen, N. N. Mahatme, K. Lilja, Haibin Wang
Publikováno v:
IEEE Transactions on Nuclear Science. 63:385-391
Two types of clock networks including clock mesh and a buffered clock tree in a daisy-chain style were utilized to synchronize 5 DFF chains and fabricated in a 28 nm bulk CMOS technology. Alpha and proton particles did not trigger any errors indicati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a3712aa62f8e9a73d019ac6e771ea394
https://doi.org/10.1109/tns.2015.2509443
https://doi.org/10.1109/tns.2015.2509443
Autor:
K. Lilja, Rick Wong, S.-J. Wen, William H. Robinson, L. Rui, Lloyd W. Massengill, L. Chen, N. N. Mahatme, Haibin Wang, M. Bounasser, Bharat L. Bhuva
Publikováno v:
IEEE Transactions on Nuclear Science. 62:2592-2598
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b6a095f5f49929f5f408fa064c545c8
https://doi.org/10.1109/tns.2015.2498152
https://doi.org/10.1109/tns.2015.2498152
Autor:
Jari Palomaki, Kari K Lilja
Publikováno v:
3DTV-Conference
Advanced imaging technology with properties like a more realistic picture with extremely high resolution and new applications and branches like welfare technology where these properties are used also involves certain ethical challenges. The protectio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f9d2e978a120ed2e8fae3d144142d952
https://doi.org/10.1109/3dtv.2017.8280396
https://doi.org/10.1109/3dtv.2017.8280396
Autor:
A. F. Witulski, Bharat L. Bhuva, Trey Reece, Rick Wong, S.-J. Wen, S. Jagannathan, T. D. Loveless, Z. J. Diggins, Lloyd W. Massengill, K. Lilja, M. P. King, W.T. Holman, N. J. Gaspard, M. Bounasser
Publikováno v:
IEEE Transactions on Nuclear Science. 60:4368-4373
Heavy-ion experimental results from flip-flops in 180-nm to 28-nm bulk technologies are used to quantify single-event upset trends. The results show that as technologies scale, D flip-flop single-event upset cross sections decrease while redundant st
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b52526a954e37a9a479ee49966e75669
https://doi.org/10.1109/tns.2013.2289745
https://doi.org/10.1109/tns.2013.2289745
Autor:
N. J. Gaspard, S. Jagannathan, M. Bounasser, Daniel Loveless, K. Lilja, J. Holst, S.-J. Wen, Rick Wong, Bharat L. Bhuva
Publikováno v:
IEEE Transactions on Nuclear Science. 60:2782-2788
Alpha, neutron, and heavy-ion single-event measurements were performed on both high-performance and hardened flip-flop designs in a 28-nm bulk CMOS technology. The experimental results agree very well with simulation predictions and confirm that even
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c2e46c105f64f02b4f8e38764bbe6f0
https://doi.org/10.1109/tns.2013.2273437
https://doi.org/10.1109/tns.2013.2273437