Zobrazeno 1 - 10
of 13
pro vyhledávání: '"K. L. Bunker"'
Autor:
James Ibbetson, K. L. Bunker, Phil Russel, Michael Leung, Jayesh Bharathan, David B. Slater, Amber C. Abare, Kevin Haberern, Dave Emerson, John Adam Edmond, Mike Bergman
Publikováno v:
Journal of Crystal Growth. 272:242-250
Group III-nitride layers have been grown via metal-organic vapor-phase epitaxy (MOVPE) on single crystal-silicon carbide (SiC) substrates and fabricated into light-emitting diodes (LEDs) and laser diodes (LDs). Deep ultraviolet (UV) LEDs from 321 to
Publikováno v:
Microelectronics Journal. 34:455-457
In this work, two methods for electrical characterization of InGaN quantum well p–n heterostructures at the nanometer level are presented. Cross-sectional Electrical Force Microscopy and High Resolution Electron Beam Induced Current (HR-EBIC) are u
Publikováno v:
Applied Physics Letters. 79:1567-1569
Minority-carrier diffusion lengths of electrons and holes were measured in a GaN-based light-emitting diode using the electron-beam-induced current technique in the line-scan configuration. A theoretical model with an extended generation source and a
Publikováno v:
Microscopy and Microanalysis. 11
Publikováno v:
Microscopy and Microanalysis. 11
Scanning Electron Microscopy (SEM)-based Cathodoluminescence (CL) experiments were used to study the influence of piezoelectric fields on the optical and electrical properties of a commercial InGaN-based Multiple Quantum Well (MQW) Light Emitting Dio
Publikováno v:
MRS Proceedings. 831
Scanning Electron Microscopy (SEM)-based Cathodoluminescence (CL) experiments were used to study the influence of piezoelectric fields on the optical and electrical properties of a commercial InGaN-based Multiple Quantum Well (MQW) Light Emitting Dio
Publikováno v:
Microscopy and Microanalysis. 10:146-147
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
Publikováno v:
Microscopy and Microanalysis. 10:194-195
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
Publikováno v:
Microscopy and Microanalysis. 9:474-475
Publikováno v:
Microscopy and Microanalysis. 8:1208-1209