Zobrazeno 1 - 10
of 132
pro vyhledávání: '"K. L. Bunker"'
Autor:
James Ibbetson, K. L. Bunker, Phil Russel, Michael Leung, Jayesh Bharathan, David B. Slater, Amber C. Abare, Kevin Haberern, Dave Emerson, John Adam Edmond, Mike Bergman
Publikováno v:
Journal of Crystal Growth. 272:242-250
Group III-nitride layers have been grown via metal-organic vapor-phase epitaxy (MOVPE) on single crystal-silicon carbide (SiC) substrates and fabricated into light-emitting diodes (LEDs) and laser diodes (LDs). Deep ultraviolet (UV) LEDs from 321 to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d2f338871667636a43496cd6d28b12b1
https://doi.org/10.1016/j.jcrysgro.2004.08.056
https://doi.org/10.1016/j.jcrysgro.2004.08.056
Publikováno v:
Microelectronics Journal. 34:455-457
In this work, two methods for electrical characterization of InGaN quantum well p–n heterostructures at the nanometer level are presented. Cross-sectional Electrical Force Microscopy and High Resolution Electron Beam Induced Current (HR-EBIC) are u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ca4dd63ce3055d51ff1e74781e790ab6
https://doi.org/10.1016/s0026-2692(03)00072-7
https://doi.org/10.1016/s0026-2692(03)00072-7
Publikováno v:
Applied Physics Letters. 79:1567-1569
Minority-carrier diffusion lengths of electrons and holes were measured in a GaN-based light-emitting diode using the electron-beam-induced current technique in the line-scan configuration. A theoretical model with an extended generation source and a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::02370c5485a2d5a62048e2fa2dd1de5c
https://doi.org/10.1063/1.1400075
https://doi.org/10.1063/1.1400075
Publikováno v:
Microscopy and Microanalysis. 11
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d59f2d412c65c8eb17d8314badccc238
https://doi.org/10.1017/s1431927605501284
https://doi.org/10.1017/s1431927605501284
Publikováno v:
Microscopy and Microanalysis. 11
Scanning Electron Microscopy (SEM)-based Cathodoluminescence (CL) experiments were used to study the influence of piezoelectric fields on the optical and electrical properties of a commercial InGaN-based Multiple Quantum Well (MQW) Light Emitting Dio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::32ae0a967362f343943f2a29cbfda17a
https://doi.org/10.1017/s1431927605507815
https://doi.org/10.1017/s1431927605507815
Publikováno v:
MRS Proceedings. 831
Scanning Electron Microscopy (SEM)-based Cathodoluminescence (CL) experiments were used to study the influence of piezoelectric fields on the optical and electrical properties of a commercial InGaN-based Multiple Quantum Well (MQW) Light Emitting Dio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::86ed62ea8bb42299425fe2d5a9f529de
https://doi.org/10.1557/proc-831-e11.41
https://doi.org/10.1557/proc-831-e11.41
Publikováno v:
Microscopy and Microanalysis. 10:146-147
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::416f7029ec6150495ec6e88b23889cdb
https://doi.org/10.1017/s1431927604884344
https://doi.org/10.1017/s1431927604884344
Publikováno v:
Microscopy and Microanalysis. 10:194-195
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b02fb5b3bd20d54f3af18dff925c5e47
https://doi.org/10.1017/s1431927604882679
https://doi.org/10.1017/s1431927604882679
Publikováno v:
Microscopy and Microanalysis. 9:474-475
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::42bb523ecc0201c66ef114ba7604e9d8
https://doi.org/10.1017/s1431927603442372
https://doi.org/10.1017/s1431927603442372
Publikováno v:
Microscopy and Microanalysis. 8:1208-1209
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::df96276c25eaf0e75e085f493130a052
https://doi.org/10.1017/s1431927602107914
https://doi.org/10.1017/s1431927602107914