Zobrazeno 1 - 1
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pro vyhledávání: '"K. J. Romand"'
Publikováno v:
Advances in X-ray Analysis. 34:105-121
In the field of material analysis and characterization interest has considerably shifted over the last few decades from bulk to surface and very thin film problems. At the present state a wide range of surface analytical techniques - such as x-ray ph
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b02b464f1a44cbf5b54bb7895439e1b2
https://doi.org/10.1154/s0376030800014373
https://doi.org/10.1154/s0376030800014373
