300 GHz optical waveform measurement by novel THz‐wave autocorrelator

Autor: Ming Che, T. Ishibashi, H. Ito, Ruo Yamamoto, Takeshi Kuboki, K. Ichiyama, Kazutoshi Kato

Publikováno v: Electronics Letters. 56:562-563

A novel THz-wave autocorrelator consisting of an optical delay line and high-speed photodiodes was proposed for the measurement of optical waveforms with a high rate of repetition. In this system, the waveform is delayed at the optical domain and cor

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3dc95ecf18308e86b1cf59ecd68a4de8
https://doi.org/10.1049/el.2019.4131

Th17 (PP-014)

Autor: A. E. Hauser, H. Wu, E. Esplugues, M. Tsuruoka, W. Niedbala, J. Elia, S. Tsuyoshi, B. Cai, V. Flamand, S. Iwamoto, M. Hirashima, S. Tanaka, H. L. Qian, H. Kai, C. Yu, A. Yoshimura, A. Yamauchi, J. Masuyama, Y. Kang, J. M. Wilson, J. Rohrer, T. Tanaka, M. Weinstein, F. Tsuji, D. Chuang, Y. Xiao, S. Yamada, E. A. M. Veraar, S. Wu, Yoh-ichi Tagawa, T. Kamiyama, S. M. Vieira, M. Tajima, S. Huber, J. C. Alves-Filho, F. Suzuki, J. Rabenstein, M. Kadowaki, K. Masuko, C. Liu, I. Debock, S. Oomizu, A. Chu, H. Aono, J. Kang, J. Lastovicka, K. Ishihara, A. Sediva, T. Arikawa, N. Malhotra, S. Miuznoe, B. Oh, X. Wang, F. Zhu, H. Yasuhara, J. M. Coquet, S. Lee, I. Matumoto, D. Wakita, T. Koga, Katsuko Sudo, K. Matsushima, S. Saijo, F. Q. Cunha, U. A. K. Betz, A. Ikejiri, H. Park, S. Y. Fukada, J. Yoon, H. Uga, O. Beretta, D. Noguchi, C. Chu, M. Roecken, H. Sepulveda, B. A. Wu-Hsieh, T. Matsuda, T. Okazawa, S. Kim, H. Hirota, H. Kitamura, Y. Liu, D. N. Herndon, T. Town, F. Liu, A. Yazdi, T. Niki, H. Lee, C. Deng, M. Kono, S. Feske, N. Ueda, R. Horvath, T. Sumida, G. Licandro, T. Nishimura, M. Harada, S. Koyasu, P. B. Ernst, M. Murakami, T. Sato, M. Suico, S. Black, M. Kanayama, Kazuo Sugane, C. Kitabayashi, K. Ghoreschi, C. Matsumoto, R. A. Flavell, T. Atsumi, M. G. Jeschke, E. A. O'Donnell, M. Nishihara, J. Borst, M. Kobayashi, Z. Lining, R. Spreafico, J. Morimoto, H. Ogura, A. Haberman, T. Kaisho, M. Pétein, N. Gagliani, T. Fukada, A. Miyazaki, J. Tschopp, G. van der Horst, J. Soh, S. Park, Yoichiroh Iwakura, T. Hu, S. Delbauve, Q. Wang, J. Ma, D. C. Gruenert, A. Mitani, Y. Miyamoto, S. Ikeda, P. Ricciardi-Castagnoli, S. Iwai, H. Watanabe, E. Huseby, T. Uede, S. Suzuki, C. McCarl, S. Hida, K. Ichiyama, I. Glocova, I. Azuma, S. Hojyo, K. Oguchi, F. Y. Liew, A. Mortellaro, J. Yu, M. Goldman, S. Nakae, A. Polouckova, J. Brueck, W. Ohashi, R. Spisek, M. Ikeda, T. Hirano, A. Inatsu, O. Kim, C. Conforti-Andreoni, M. Yanagida, S. Khalil, Masaya Takamoto, M. Festing, M. Mamura, S. Miaw, H. Kurata, M. Kanamoto, S. Nagai, U. Ikeda

Publikováno v: International Immunology. 22:i96-i101

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::88215d3af015208cab10445f1625ca06
https://doi.org/10.1093/intimm/dxq101

Mismatch-Tolerant Circuit for On-Chip Measurements of Data Jitter

Autor: K. Ichiyama, M. Ishida, Takahiro Yamaguchi, Mani Soma

Publikováno v: CICC

A new design for a mismatch-tolerant on-chip data jitter measurement circuit in 0.11-mum CMOS is experimentally verified in this paper. It utilizes a data-to-clock converter, pulse generators, and an integrator followed by a sample-&-hold. The circui

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::85129136acaeead7fb0772ae32be19c6
https://doi.org/10.1109/cicc.2007.4405704

An On-Chip Delta-Time-to-Voltage Converter for Real-Time Measurement of Clock Jitter

Autor: M. Ishida, K. Ichiyama, Mani Soma, Takahiro Yamaguchi

Publikováno v: ISCAS

This paper proposes a new method for measuring clock jitter using a delta-time-to-voltage converter. The method has been implemented in 0.11-mum CMOS technology, and has been verified experimentally to at least 2.8 GHz.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::83947b11042eaacf4286c72f591cc867
https://doi.org/10.1109/iscas.2007.378634

A real-time jitter measurement board for high-performance computer and communication systems

Autor: Mani Soma, Masahiro Ishida, Takahiro Yamaguchi, M. Sugai, K. Christian, K. Ohsawa, K. Ichiyama

Publikováno v: ITC

This work presents the design and performance results of a real-time jitter measurement board for testing high-frequency clocks and data transceivers. The board targets high-volume manufacturing test to measure sinusoidal jitter tolerance and random

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::0e8c166252739ae6fb33331fbe9daa7e
https://doi.org/10.1109/test.2004.1386939