Zobrazeno 1 - 10
of 50
pro vyhledávání: '"K. H. Franke"'
Publikováno v:
Photonics and Education in Measurement Science 2019.
This paper presents a principle for scene-related camera calibration in Manhattan worlds. The proposed estimation of extrinsic camera parameters from vanishing points represents a useful alternative to the traditional target-based calibration methods
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::912252281792fc440e994594900afe7a
https://doi.org/10.1117/12.2530875
https://doi.org/10.1117/12.2530875
Autor:
Daniel Dipl.-Ing. Kapusi, Eberhard Manske, T. Machleidt, K. H. Franke, Nataliya Dorozhovets, E. Sparrer
Publikováno v:
tm - Technisches Messen. 76:274-277
This article discusses methods to measure samples up to 25×25 mm2 using the NPMM [1] as an atomic force microscope (AFM) [2]. An entire scan at full resolution (10 nm) and 10 μm/s scan speed would take about 200 years. Therefore, overview scans wit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c481aa32f31794754d5a0c4096969f8d
https://doi.org/10.1524/teme.2009.0968
https://doi.org/10.1524/teme.2009.0968
Publikováno v:
tm - Technisches Messen. 75:547-575
Zusammenfassung Seit geraumer Zeit werden durch Forschergruppen an verschiedenen Stellen Anstrengungen unternommen, bildhafte Messdaten von Rasterkraftmikroskopen (AFM) mit dem aus der Bildverarbeitung verfügbaren Methodenrepertoire zu verbessern. I
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::af94e8b47392f0f4bf713138dc578ec6
https://doi.org/10.1524/teme.2008.0885
https://doi.org/10.1524/teme.2008.0885
Autor:
V. Cimalla, Oliver Ambacher, K. H. Franke, T. Machleidt, Lothar Spiess, Henry Romanus, M. Niebelschütz
Publikováno v:
Ultramicroscopy. 107:1086-1090
Knowledge of tip geometry is necessary for reproducible atomic force microscope (AFM) measurements. This is particularly important for measurements in contact mode, in which a certain wear of the tip will always occur. For small or flat structures or
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1ff2ff86d4d3aba7bdec83a294c8edea
https://doi.org/10.1016/j.ultramic.2007.05.004
https://doi.org/10.1016/j.ultramic.2007.05.004
Autor:
M. Niebelschütz, Lothar Spiess, V. Cimalla, Henry Romanus, J. Schadewald, T. Machleidt, K. H. Franke, Oliver Ambacher
Publikováno v:
Microelectronic Engineering. 84:524-527
Positioning on the nanometer scale with replaceable nanotools requires well defined positioning marks to restore the coordinate system with nanoscale accuracy. In this work we propose such patterns (references, markers) consisting of self-organized s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bb37efb07de30b0d70b820e3270fbabc
https://doi.org/10.1016/j.mee.2006.10.076
https://doi.org/10.1016/j.mee.2006.10.076
Publikováno v:
Measurement Science and Technology. 18:520-527
With the nanopositioning and nanomeasuring machine (NPM-Machine) developed at the Technische Universitat Ilmenau, subnanometre resolution and nanometre uncertainty in a measuring volume of 25 × 25 × 5 mm3 have been demonstrated in the last few year
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6edbf4e45a5d3c81d3bd78fa2b8e6c46
https://doi.org/10.1088/0957-0233/18/2/s27
https://doi.org/10.1088/0957-0233/18/2/s27
Autor:
Oliver Ambacher, Enrique Calleja, T. Machleidt, K. H. Franke, Miguel Sanchez-Garcia, M. Niebelschütz, J. Ristic, Volker Cimalla, Javier Grandal
Publikováno v:
Physica Status Solidi B, ISSN 0370-1972, 2008-05, Vol. 5, No. 6
Archivo Digital UPM
Universidad Politécnica de Madrid
Archivo Digital UPM
Universidad Politécnica de Madrid
High quality InN and GaN nanocolumns of different length and diameter grown by molecular beam epitaxy (MBE) were electrically characterized directly and non-destructively by Atomic Force Microscopy (AFM) as a function of the column diameter. The “e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d73d5c9324bc5cd39272337aa5547e3e
https://doi.org/10.1002/pssc.200778533
https://doi.org/10.1002/pssc.200778533
Autor:
Eberhard Manske, G. Linß, K. H. Franke, T. Machleidt, O. Birli, E. Sparrer, H.-C. Schwannecke, M. Weiß, F. Schale
Publikováno v:
SPIE Proceedings.
Nanopositioning and nanomeasuring machines (NPM machines) developed at the Ilmenau University of Technology allow the measurement of micro- and nanostructures with nanometer precision in a measurement volume of 25 mm × 25 mm × 5 mm (NMM-1) or 200 m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d220d53d0b9b0aa705b70f9663cbcf25
https://doi.org/10.1117/12.2020538
https://doi.org/10.1117/12.2020538
Publikováno v:
Tagungsband.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eab243454a70568c88e145ccdee5f45b
https://doi.org/10.5162/sensoren2012/4.3.3
https://doi.org/10.5162/sensoren2012/4.3.3
Publikováno v:
ReConFig
High performance image processing applications area challenging field when targeting embedded processing. Field programmable gate arrays (FPGA) receive a growing interest as implementation platforms, but these solutions have to compete with the state
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d054f77efc72373d6ae1045c1f9de9c1
https://doi.org/10.1109/reconfig.2011.45
https://doi.org/10.1109/reconfig.2011.45