Zobrazeno 1 - 10
of 21
pro vyhledávání: '"K. Forcht"'
Publikováno v:
Thin Solid Films. :808-813
A combination of ellipsometric and photometric measurements provides a convenient and accurate method for the determination of the optical properties of thick polymer films. Of course, a reasonably good surface and layer quality is necessary. Multipl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::57cb7f1e2616028b5ee01c0d817a5831
https://doi.org/10.1016/s0040-6090(97)01000-6
https://doi.org/10.1016/s0040-6090(97)01000-6
Publikováno v:
Thin Solid Films. 302:43-50
A relationship between Jones and Mueller matrices originally derived for random media is applied to incoherence effects in photometric ellipsometry. Such effects are for example depolarization after reflection from a sample with varying film thicknes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0ebae331d3e2646531dd34d004b85c23
https://doi.org/10.1016/s0040-6090(96)09555-7
https://doi.org/10.1016/s0040-6090(96)09555-7
Autor:
D. Doering, K. Forcht
Publikováno v:
SPIE Proceedings.
The antireflection coatings which are used on lenses and other optical interfaces can have a profound effect on the image quality formed by an optical system. This paper evaluates the effects on optical performance of s- and p-phase shifts due to coa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a86c5964cc1719f680fbb8022775e87d
https://doi.org/10.1117/12.797414
https://doi.org/10.1117/12.797414
Publikováno v:
Applied optics. 36(1)
Reflections from the back surface of a transparent substrate influence the evaluation of optical constants of thin films from ellipsometric measurements. If the thickness of the substrate is large compared with the coherence length of the light, the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e1bb2114b54ab9f19dfff3b23c93698a
https://pubmed.ncbi.nlm.nih.gov/18250677
https://pubmed.ncbi.nlm.nih.gov/18250677
Publikováno v:
SPIE Proceedings.
Ellipsometry is a powerful technique for the determination of complex refractive indices ^n equals n plus ik of thin absorbing films deposited on a substrate. If the films are deposited onto an opaque substrate, the calculation methods are well-known
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a5584fdfd19af71da7d62e48ddcc0c9c
https://doi.org/10.1117/12.218188
https://doi.org/10.1117/12.218188
Autor:
Michael Koehl, C. Sanowski, Josef Steinhart, K. Forcht, Andreas Gombert, Franz Brucker, Wolfgang Graf
Publikováno v:
SPIE Proceedings.
An apparatus was built to measure the spectral hemispherical reflectance and transmittance at variable angles of incidence. The apparatus consists of a Fourier-transform spectrometer, polarizers, and two integrating spheres. With one of the spheres,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::13dcc4b97b97c1fa62816ce5cec2a2cc
https://doi.org/10.1117/12.217338
https://doi.org/10.1117/12.217338
The optical constants of thin sputtered molybdenum layers, embedded in a ceramic-metal composite produced by a batch sputtering deposition system were analyzed. This was accomplished by assuming a multilayer system for a tin oxide-molybdenum cermet a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b4a04d6d70b660787fddde22443ffe4d
https://publica.fraunhofer.de/handle/publica/185784
https://publica.fraunhofer.de/handle/publica/185784
Publikováno v:
SPIE Proceedings.
The optical constants of thin sputtered molybdenum layers, embedded in a ceramic-metal composite, which was produced by a batch sputtering deposition system, were analyzed. This was done by assuming a multilayer system for a tin oxide-molybdenum cerm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c46285b6e9e6a29c7d55f6eb873afed1
https://doi.org/10.1117/12.185371
https://doi.org/10.1117/12.185371
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