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pro vyhledávání: '"K. E. Moebus"'
Autor:
Paulius Sakalas, M. Ramonas, Christoph Jungemann, A. Mukherjee, K. E. Moebus, J. Herricht, Michael Schroter
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 60:3403-3412
A systematic method for the integration of correlated shot-noise sources into compact models (CMs) is presented, which significantly improves the accuracy of predicted high-frequency noise in transistors. The developed method relies on a system theor