Discovery of compounds inhibiting the ADP-ribosyltransferase activity of pertussis toxin

Autor: Ashok, Y. (Yashwanth), Miettinen, M. (Moona), de Oliveira, D. K. (Danilo Kimio Hirabae), Tamirat, M. Z. (Mahlet Z.), Näreoja, K. (Katja), Tiwari, A. (Avlokita), Hottiger, M. O. (Michael O.), Johnson, M. S. (Mark S.), Lehtiö, L. (Lari), Pulliainen, A. T. (Arto T.)

The targeted pathogen-selective approach to drug development holds promise to minimize collateral damage to the beneficial microbiome. The AB₅-topology pertussis toxin (PtxS1-S5) is a major virulence factor of Bordetella pertussis, the causative ag

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______2423::506e40be02e8287d5785da1c6123639a
http://urn.fi/urn:nbn:fi-fe2020051435585

Microstructure and electrical characterization based on AFM of very high-doped polysilicon grains

Autor: K. Danilo, E. Picard, R. Coq Germanicus, Bernadette Domengès, R. Rogel

Publikováno v: Applied Surface Science
Applied Surface Science, Elsevier, 2007, 253 (14), pp.6006-6012
Applied Surface Science, Elsevier, 2007, 253 (14), pp.6006-6012. ⟨10.1016/j.apsusc.2006.12.114⟩
Applied Surface Science, 2007, 253 (14), pp.6006-6012. ⟨10.1016/j.apsusc.2006.12.114⟩

International audience; In this work, we demonstrate that atomic force microscopy allows topography measurement as well as the local electrical properties of very high-doped polysilicon film prior to any subsequent annealing. AFM and TEM observations

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1214583101b80a28a74c9793e4a60e72
https://doi.org/10.1016/j.apsusc.2006.12.114

Comprehensive Nano-Structural Approach of SSRM Nanocontact on Silicon through TEM-STEM Study

Autor: K. Danilo, T. Delaroque, Bernadette Domengès, A. Colder

Publikováno v: International Symposium for Testing and Failure Analysis.

Scanning Spreading Resistance Microscopy electro-mechanical nanocontacts are nowadays well understood and numerous influent parameters have been identified (Bias, load, surface state of the sample, radius of curvature of the tip). Despite several sim

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::59038719a2c20a8839c0862b7503568a
https://doi.org/10.31399/asm.cp.istfa2011p0132

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