Zobrazeno 1 - 10
of 22
pro vyhledávání: '"K. Chubur"'
Autor:
Konstantin Zolnikov, Oleg Cherkasov, Aleksey Platonov, Vladimir Belokurov, Svetlana Evdokimova, I. Strukov, K. Chubur
Publikováno v:
Modeling of systems and processes. 15:125-133
The paper considers the processes occurring during the absorption of ionizing radiation energy. The task of developing mathematical models for determining the temperature of layers of a multilayer structure due to radiation absorption, the appearance
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::314fc611e3042ce05d21530bf8acfe27
https://doi.org/10.12737/2219-0767-2022-15-1-125-133
https://doi.org/10.12737/2219-0767-2022-15-1-125-133
Autor:
Yu. Chevychelov, Oleg Cherkasov, Aleksey Platonov, Vladimir Volkov, Svetlana Evdokimova, I. Strukov, K. Chubur
Publikováno v:
Modeling of systems and processes. 15:133-140
When studying the radiation effect on microcircuits, the problem arises of calculating the absorbed energy. Often it comes down to determining the radiation resistance of microcircuits. However, in some cases it is necessary to determine the distribu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::decec861c1f1804e877c38673defd239
https://doi.org/10.12737/2219-0767-2022-15-1-133-140
https://doi.org/10.12737/2219-0767-2022-15-1-133-140
Publikováno v:
Modeling of systems and processes. 13:58-65
The article discusses methods and technologies for testing chips using test crystals and describes the structure of such crystals developed as a chip for research. Diagrams of the I / O element verification block, the core element verification block,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a2e2c4025dcaccce2b527414a07f9910
https://doi.org/10.12737/2219-0767-2020-13-3-58-65
https://doi.org/10.12737/2219-0767-2020-13-3-58-65
Publikováno v:
Modeling of systems and processes. 13:83-87
The article discusses two main stages of the test loading process during chip design: performing the test procedure and copying the main program and running it. A detailed description of the tests is provided. When describing the loading process of t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::792d309aead03ee28d1be5059fa031c1
https://doi.org/10.12737/2219-0767-2020-13-1-83-87
https://doi.org/10.12737/2219-0767-2020-13-1-83-87
Publikováno v:
Modeling of systems and processes. 12:78-83
individual nuclear particles, single events, heavy charged particles, integrated circuits (IC), stability, linear energy losses, physical model
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e93d704630a8ea6de6eb09649a90993f
https://doi.org/10.12737/2219-0767-2020-12-4-78-83
https://doi.org/10.12737/2219-0767-2020-12-4-78-83
Autor:
K. Chubur, Sergey Grechanyy
Publikováno v:
Modeling of systems and processes. 12:17-24
The article describes methods for ensuring resistance to heavy charged particles (HCP) of the RAM block of the microprocessor. A description of the implementation and a block diagram of static memory based on dummy blocks is given. The paper consider
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::81dd4be510a8abe95b60d67dff900529
https://doi.org/10.12737/2219-0767-2020-12-4-17-24
https://doi.org/10.12737/2219-0767-2020-12-4-17-24
Publikováno v:
Modeling of systems and processes. 12:73-77
The article considers the influence of scaling effects on the stability of integrated circuits (IC) under the influence of cosmic particles. There are two directions of scaling: reduction of topological dimensions of IC elements and optimization of e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0a10427a7b478470404139e0accc76e7
https://doi.org/10.12737/2219-0767-2020-12-4-73-77
https://doi.org/10.12737/2219-0767-2020-12-4-73-77
Autor:
I. Strukov, A. Kulay, Sergey Grechanyy, Vladimir Zolnikov, A. Yankov, V. Kryukov, K. Chubur, Oleg Kvasov, A. Yagodkin, V. Antsiferova, Svetlana Evdokimova
Publikováno v:
Modeling of systems and processes. 12:48-53
The paper deals with the issues of resistance of linear voltage stabilizers to the influence of special factors. The conducted researches are described, electric schemes at measurement of output voltage and current of chips are resulted. The calculat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dfa2b8d3f7a278d84a860cf025367424
https://doi.org/10.12737/2219-0767-2019-12-3-48-53
https://doi.org/10.12737/2219-0767-2019-12-3-48-53
Publikováno v:
Materials of the All-Russian Scientific and Practical Conference "Modern aspects of modeling systems and processes".
This article discusses the development of effective methods and tools for assessing the fault tolerance of logical circuits, the mechanism of logical masking, the development of the route of re-synthesis of combinational circuits, methods for increas
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::313ea54697d51f29a2522a7705ba7b78
https://doi.org/10.34220/mamsp_234-241
https://doi.org/10.34220/mamsp_234-241
Autor:
Ekaterina Grosheva, A. Yagodkin, Sergey Grechanyy, K. Chubur, I. Strukov, Konstantin Zolnikov
Publikováno v:
Materials of the All-Russian Scientific and Practical Conference "Modern aspects of modeling systems and processes".
This article discusses the technical means of monitoring the performance of a special-purpose ECB for experimental evaluation of radiation resistance, in the absence of test measuring equipment that allows you to control the areas of the most degrade
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c107be3050dd453af307825b8d5b7656
https://doi.org/10.34220/mamsp_253-256
https://doi.org/10.34220/mamsp_253-256