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Atomic force microscope based analysis of bound and bound+mobile phase monolayer behavior under mechanical and electrical stress

Autor: J. S. Zabinski, K. C. Eapen, J. J. Nainaparampil

Publikováno v: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 22:2337

One of the major problems with microelectromechanical systems (MEMS) is the stiction caused by capillary, van der Waals, electrostatic, and chemical forces. Self-assembled monolayers are extensively used to resolve this problem and they have been eff

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::f752f9888e98b0fdae81ad1c8272bb7d
https://doi.org/10.1116/1.1787517

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Autor: K. C. Eapen, L. M. Yeddanapalli

Publikováno v: Die Makromolekulare Chemie. 119:4-16

In view of the differences in the positional reactivities, reported by different authors, in phenol and methylol phenols, an exhaustive kinetic study using quantitative paper chromatography has been carried out not only on phenol and methylol phenols

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::be37f02c90852b7e5a28e1e001107272
https://doi.org/10.1002/macp.1968.021190102

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