Zobrazeno 1 - 10
of 47
pro vyhledávání: '"K.‐H. Bäther"'
Publikováno v:
Materialwissenschaft und Werkstofftechnik. 27:9-13
Durch Implantation von Stickstoff-Ionen wurde die Randschicht der Ti-Al6-V4-Legierung mit dem Ziel der Verbesserung des Verschleisverhaltens modifiziert. Es wurde dazu mit unterschiedlichen Stickstoffdosen bis 1 · 1018N+/cm2 bei E = 170 keV implanti
Autor:
K.-H. Bäther, U. Herrmann
Publikováno v:
Surface and Coatings Technology. :670-675
Polyimide foils were implanted with different ions (from light He + ions to heavy Ar + ions) in the energy region from 25 keV to 170 keV and ion doses from 1 x 10 15 to 2 x 10 17 ions cm −2 . The electrical properties (sheet resistivity), optical p
Publikováno v:
Surface and Coatings Technology. :793-801
The refractory metal nitrides Ti-N, Zr-N, V-N, Nb-N, Ta-N, Cr-N, Mo-N and W-N and in addition the Al-N and Si-N systems were deposited with conventional d.c. magnetron sputtering and with ion-beam-assisted deposition on thermally oxidized silicon waf
Publikováno v:
Vacuum. 44:827-835
Vacuum deposited high resistivity heating elements were developed for application in thermal print heads by using reactively sputtered CrSi(W)N. Analytical investigations on the temperature behaviour of the film system and loading studies by tempe
Autor:
K.-H. Bäther, H. Schreiber
Publikováno v:
Thin Solid Films. 200:93-116
The effect of TiNxOy barrier films (0 ⩽ x ⩽ 1.0;y ⩽ 0.12) on interdiffusion and interface reaction was investigated in Cr-Si-(O)/TiNxOy/Al layered films and compared with the results for Cr-Si-(O)/Al. The film systems were deposited on Si/SiO2
Publikováno v:
Thin Solid Films. 188:67-83
The interactions in the (CrSi)/Al and (CrSiO)/Al film systems as a result of thermal load were investigated with regard to the electrical properties and the metallurgical stability. The layers were deposited on Si/SiO 2 and NaCl substrates u
Autor:
G. Zies, K.‐H. Bäther
Publikováno v:
physica status solidi (a). 119:503-510
The effect of the film thickness on the metallurgical and electrical stability of CrSiO/VO/Al film systems is investigated. The film systems are prepared on Si/SiO2 substrates by dc planar magnetron sputtering in vacuum sequence. Their electrical res
Publikováno v:
Physica Status Solidi (a). 67:533-542
The dc degradation behaviour of ZnO varistors as a function of the variables current, temperature, and time is investigated. The degradation rate is phenomenologically presented by an equation reflecting the observed aging behaviour in dependence on
Autor:
K.-H. Bäther
Publikováno v:
Kristall und Technik. 9:1315-1325
Beim Schalten an Cu2O wird das Auftreten hoher Temperaturen nachgewiesen. Die Struktur des formierten Kanals wird untersucht. Auf der Grundlage des Phasendiagramms wird ein einfaches und qualitatives Modell fur den Durchschlag an Cu2O beschrieben und
Autor:
K.‐H. Bäther, W. Brückner
Publikováno v:
Kristall und Technik. 11:991-998
The frequency distribution of the threshold voltage of AgCu2OAg switching devices was experimentally established. With a few switching cycles (n ≲ 150) distribution can be interpreted by a numerical Gauss distribution. Only a single, from electrode