Zobrazeno 1 - 4
of 4
pro vyhledávání: '"K-O. Hofacker"'
Publikováno v:
Proceedings Ninth Annual IEEE International ASIC Conference and Exhibit.
Compact and fast photoreceivers with on-chip photodiodes in standard CMOS technology have been developed as optical inputs for digital circuits. The time performance of different photodiodes and current/voltage converters has been investigated and op
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::125c60e705454909d77201bbf6172c32
https://doi.org/10.1109/asic.1996.551951
https://doi.org/10.1109/asic.1996.551951
Publikováno v:
1997 IEEE International Conference on Microelectronic Test Structures Proceedings.
Conventional needle probe techniques do not permit wafer level tests at frequencies above about 100 MHz. As an alternative to special probes like microwave strip lines optical inputs have been designed which have been shown to operate up to 800 MHz i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ae18ddd80fd8efd9166398da57c304fe
https://doi.org/10.1109/icmts.1997.589326
https://doi.org/10.1109/icmts.1997.589326
Autor:
D. McClymont, C. Dietrich, H. Bergner, C. Swiatkowski, K-O. Hofacker, K. Hempel, M. Pohland, D. Runge, J. Sturm, G. Sargsjan, F. Esfahani, A. Benedix, H.H. Berger, D. Bartelt, J. Degenhardt
Publikováno v:
International Symposium for Testing and Failure Analysis.
Conventional needle probecard techniques suffer from several problems: needles scratch the pads causing bonding problems, the maximum test speed is limited by the poor high frequency performance of the needle contacts. This contribution presents a ne
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a670663c8accfac1e06e959d3a65acd8
https://doi.org/10.31399/asm.cp.istfa1996p0263
https://doi.org/10.31399/asm.cp.istfa1996p0263
Conference
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