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Publikováno v:
Nanotechnology. 17:2135-2145
Measurement of atomic force microscope cantilever spring constants (k) is essential for many of the applications of this versatile instrument. Numerous techniques to measure k have been proposed. Among these, we found the thermal noise and Sader meth
Publikováno v:
Nanotechnology; May2006, Vol. 17 Issue 9, p2135-2145, 11p