Zobrazeno 1 - 7
of 7
pro vyhledávání: '"K A Gesheva"'
Publikováno v:
Journal of Physics: Conference Series. 682:011001
We are pleased to introduce the Proceedings of the Conference ''Light in Nanoscience and Nanotechnology 2015'' (LNN 2015) organized by the Institute of Solid State Physics, Bulgarian Academy of Sciences in the frames of the INERA Project ''Research a
Electrochromic and optical study of atmospheric pressure chemical vapour deposition MoO3-Cr2O3 films
Publikováno v:
Journal of nanoscience and nanotechnology. 11(9)
Electrochromism (EC) is a phenomenon in which materials are able to change their optical properties in a reversible and persistent way under the action of a voltage pulse. The studied MoO3-Cr2O3 films are obtained by atmospheric pressure CVD. Mixing
Publikováno v:
Photovoltaic and Photoactive Materials — Properties, Technology and Applications ISBN: 9781402008245
The optical absorption in APCVD thin films of MoO3, WO3 and mixed MoO3- WO3 was studied in the range 300–850 nm, by spectrophotometry. Annealing at 400°C resulted in an increased absorption in mixed oxide films, while for the MoO3 and WO3 films a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1839a6029d649686e9ec87450655b27b
https://doi.org/10.1007/978-94-010-0632-3_29
https://doi.org/10.1007/978-94-010-0632-3_29
Publikováno v:
Journal of Physics: Conference Series. 559:012002
Transition metal oxides (TMO) exhibit electrochromic effect. Under a small voltage they change their optical transmittance from transparent to collored (absorbing) state. The individual material can manifest its electrochromic properties only when it
Autor:
K. A. Gesheva, T. Ivanova
Publikováno v:
Chemical Vapor Deposition; Apr2006, Vol. 12 Issue 4, p231-238, 8p
Autor:
S I Boyadjiev, N Stefan, I M Szilágyi, N Mihailescu, A Visan, I N Mihailescu, G E Stan, C Besleaga, M T Iliev, K A Gesheva
Publikováno v:
Journal of Physics: Conference Series; 2017, Vol. 780 Issue 1, p1-1, 1p
Publikováno v:
Journal of Materials Science: Materials in Electronics; October/December2003, Vol. 14 Issue 10-12, p755-756, 2p