HLS-based Optimization of Tau Triggering Algorithm for LHC: a case study

Autor: Cherezova, Natalia, Mihhailov, Dmitri, Devadze, Sergei, Jutman, Artur

With the current increase in the data produced by the Large Hadron Collider (LHC) at CERN, it becomes important to process this data in a corresponding manner. To begin with, to efficiently select events that contain relevant information from a massi

Externí odkaz: http://arxiv.org/abs/2212.04374

Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications

Autor: Natalia Cherezova, Konstantin Shibin, Maksim Jenihhin, Artur Jutman

Publikováno v: Microelectronics Reliability. 146:115010

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::37d440e1c6053ad43ddac2d577c86370
https://doi.org/10.1016/j.microrel.2023.115010

IEEE European Test Symposium (ETS)

Autor: Elena Ioana Vatajelu, Jaan Raik, Matteo Sonza Reorda, Mehdi B. Tahoori, Maria K. Michael, Artur Jutman, Stephan Eggersgluss, Said Hamdioui

Publikováno v: IEEE International Test Conference (ITC'2019)
IEEE International Test Conference (ITC'2019), Nov 2019, Washington DC, United States. IEEE
ITC
IEEE International Test Conference (ITC'2019), Nov 2019, Washington DC, United States. pp.1-4, ⟨10.1109/ITC44170.2019.9000148⟩

International audience; This paper is dedicated to the IEEE European Test Symposium (ETS). It offers an overview of all the European Test Workshop and Symposium events, from its first edition in 1996 to the next edition in 2020.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::251e7241dae7d24e66b5989df932784e
https://hal.archives-ouvertes.fr/hal-02506911

Ways for board and system test to benefit from FPGA embedded instrumentation

Autor: Sergei Odintsov, Thomas Wenzel, Artur Jutman, Igor Aleksejev, Sergei Devadze, Heiko Ehrenberg

Publikováno v: 2019 IEEE AUTOTESTCON.

With continually growing adoption of FPGA based designs, and more features and capabilities available in FPGAs, board and system level test applications can - and should - take advantage of FPGA embedded instrumentation. Such FPGA assisted tests not

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::b66114e0694dbed3754f167a7eed5c1e
https://doi.org/10.1109/autotestcon43700.2019.8961057

A new FPGA-based Detection Method for Spurious Variations in PCBA Power Distribution Network

Autor: Artur Jutman, Corrado De Sio, Sergei Odintsov, Ludovica Bozzoli, Luca Sterpone

Publikováno v: DDECS

Nowadays, increasing demand for High-Performance Systems produces significant growth in usage of Field Programmable Gate Arrays (FPGAs) for different applications thanks to their flexibility and high level of parallelism. Such systems rely on complex

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::08bdd1ca31ecc56850ad96a422d511e1
http://hdl.handle.net/11583/2735942