Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Justin Reiter"'
Autor:
Michael Gurr, Justin Reiter, Samuel Graham, Stephen Huerster, Ali Shakouri, David H. Altman, Dustin Kendig, Georges Pavlidis
Publikováno v:
2018 91st ARFTG Microwave Measurement Conference (ARFTG).
Shrinking features and growing device complexity in advanced microwave devices has increased the challenge of fully understanding device thermal behavior on the sub-micron scale. Predicting the device static and dynamic thermal behavior is essential
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::55fd7836c45751195acfed2782765820
https://doi.org/10.1109/arftg.2018.8423808
https://doi.org/10.1109/arftg.2018.8423808
Publikováno v:
2016 IEEE MTT-S International Microwave Symposium (IMS).
Transient thermal response provides rich information about the thermal behavior of advanced transistors and devices. We present the transient thermal modeling and analysis based on an instantaneous thermal imaging technology with transistor level spa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b0984d50c9cc74b5da05e91151583435
https://doi.org/10.1109/mwsym.2016.7540354
https://doi.org/10.1109/mwsym.2016.7540354