Zobrazeno 1 - 10
of 38
pro vyhledávání: '"Justin R. Serrano"'
Autor:
Timothy C. Marinone, Justin R. Serrano, Robert Joseph Cordova, Robert A. Sayer, Timothy S. Fisher, Timothy P. Koehler, Stephen L. Hodson
Publikováno v:
International Journal of Micro-Nano Scale Transport. 5:81-94
Removal of waste heat generated via Joule heating during the operation of electronic devices is critical to overall system performance and reliability. A significant fraction of the overall thermal budget is consumed by heat transfer across the inter
Publikováno v:
International Journal of Thermophysics. 31:2380-2393
Thermoreflectance techniques are powerful tools for measuring thermophysical properties of thin film systems, such as thermal conductivity, Λ, of individual layers, or thermal boundary conductance across thin film interfaces (G). Thermoreflectance p
Publikováno v:
International Journal of Heat and Mass Transfer. 52:2255-2264
The absorption of optical energy and subsequent thermal transport are investigated experimentally and numerically for 500 μm long, 250 μm wide, and 2.25 μm thick polycrystalline silicon microcantilevers irradiated by an 808 nm continuous-wave lase
Autor:
Justin R. Serrano, Leslie M. Phinney
Publikováno v:
Sensors and Actuators A: Physical. 134:538-543
Bent-beam, polycrystalline silicon MEMS thermal actuators were optically powered using laser illumination. The actuators were designed with a target suspended between angled legs that expand creating displacement and force when the target is heated b
Publikováno v:
Journal of Heat Transfer. 129:329-334
In this work, the use of Raman Stokes peak location and linewidth broadening methods were evaluated for thermometry applications of polysilicon microheaters subjected to evolving thermal stresses. Calibrations were performed using the temperature dep
Publikováno v:
Journal of Micromechanics and Microengineering. 16:1128-1134
Micro-Raman spectroscopy has proven to be a valuable tool for obtaining temperature measurements in active semiconductor and MEMS devices. By using the temperature-calibrated response of the polysilicon Raman signature, we have obtained spatially res
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 24:324-327
Compressively stressed SiO2 films are deposited by rf magnetron sputtering onto polymethylmethacrylate- (PMMA) coated Si substrates. The oxide film roughens by wrinkling during deposition; wrinkling is enabled by the viscous flow of the PMMA layer. T
Autor:
Timothy S. Fisher, Justin R. Serrano, Robert A. Sayer, Stephen L. Hodson, Scott M. Dalton, Timothy P. Koehler
Publikováno v:
Volume 8B: Heat Transfer and Thermal Engineering.
Thermal interface materials (TIMs) serve a critical role in the thermal management of electronic systems by enhancing the flow of heat from source to sink. Nanostructured materials, such as arrays of carbon nanotubes (CNTs) have been shown to outperf
Publikováno v:
Journal of Heat Transfer. 135
Accurate thermal conductivity values are essential for the successful modeling, design, and thermal management of microelectromechanical systems (MEMS) and devices. However, the experimental technique best suited to measure the thermal conductivity o
Autor:
Justin R. Serrano, Thomas E. Beechem, Christopher B. Saltonstall, Patrick E. Hopkins, Pamela M. Norris
Publikováno v:
The Review of scientific instruments. 84(6)
Despite a larger sensitivity to temperature as compared to other microscale thermometry methods, Raman based measurements typically have greater uncertainty. In response, a new implementation of Raman thermometry is presented having lower uncertainty