Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Juseop Park"'
Autor:
Juseop Park, Kee-Won Kwon
Publikováno v:
2018 IEEE International Memory Workshop (IMW).
The efficient built-in self test scheme is proposed for dynamic random-access memory to compensate process and voltage variation. The time-to-digital converter detects the relative process and voltage variation and compensation is proceeded with an a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c940f28f0ea7b08f557e64154151297
https://doi.org/10.1109/imw.2018.8388779
https://doi.org/10.1109/imw.2018.8388779
Autor:
Kyomin Sohn, Taesik Na, Indal Song, Yong Shim, Wonil Bae, Sanghee Kang, Dongsu Lee, Hangyun Jung, Hanki Jeoung, Ki-Won Lee, Junsuk Park, Jongeun Lee, Byunghyun Lee, Inwoo Jun, Juseop Park, Junghwan Park, Hundai Choi, Sanghee Kim, Haeyoung Chung, Young Choi, Dae-Hee Jung, Jang Seok Choi, Byungsick Moon, Jung-Hwan Choi, Byungchul Kim, Seong-Jin Jang, Joo Sun Choi, Kyung Seok Oh
Publikováno v:
2012 IEEE International Solid-State Circuits Conference.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::067b573eacb4ae8744e734ab6cf63573
https://doi.org/10.1109/isscc.2012.6176868
https://doi.org/10.1109/isscc.2012.6176868