Zobrazeno 1 - 2
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pro vyhledávání: '"Jungwon Bae"'
Autor:
Jungwon Bae, Jonghoon Kim, Jongbum Lee, Myunghoon Oak, Minju-Shin Minju-Shin, Jung-Bae Lee, Kyungrak-Cho Kyungrak-Cho, Tae-Young Oh, Hongsun Hwang, Sung-Hoon Park, Choongsun Park
Publikováno v:
International Symposium for Testing and Failure Analysis.
Rapid and accurate root cause analysis of the defect contributes to improvement in yield and quality in semiconductor manufacturing system. In particular, imperfection of final test can cause major problems for customers, so analysis on root cause of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3367fb1a23782adee7b0dc8cc3a7a950
https://doi.org/10.31399/asm.cp.istfa2019p0430
https://doi.org/10.31399/asm.cp.istfa2019p0430
Autor:
ASM Interational
The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip d
