Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Jungjoon Ahn"'
Publikováno v:
2021 International Conference on IC Design and Technology (ICICDT).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c4585278ff689000eb7061a9618ebafb
https://doi.org/10.1109/icicdt51558.2021.9626514
https://doi.org/10.1109/icicdt51558.2021.9626514
Autor:
Papa K. Amoah, Christopher E Sunday, Chukwudi Okoro, Jungjoon Ahn, Lin You, Dmitry Veksler, Joseph Kopanski, Yaw Obeng
Publikováno v:
ECS Meeting Abstracts. :859-859
In this talk, we present an overview of our current research focus in developing non-destructive metrology for monitoring reliability issues in 3D-integrated electronic systems. Working closely with the semiconductor industry, we have been looking at
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9551a0fca750d1052b0000a782b864f8
https://doi.org/10.1149/ma2022-0217859mtgabs
https://doi.org/10.1149/ma2022-0217859mtgabs
Publikováno v:
ACS Nano. 13:3924-3930
The advent of recent technologies in the nanoscience arena requires new and improved methods for the fabrication of multiscale features (e.g., from micro- to nanometer scales). Specifically, biological applications generally demand the use of transpa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e32af13bc59277c3840befc1d66a892a
https://doi.org/10.1021/acsnano.8b07004
https://doi.org/10.1021/acsnano.8b07004
Publikováno v:
ACS Appl Bio Mater
Neutral red is a low-cost supravital stain for determining cell viability. The standard protocol relies on a destructive extraction process to release the accumulated dye for endpoint spectrophotometric quantification. We report a non-destructive, li
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a91842bc4914fecc40a2b764d0a8f444
https://europepmc.org/articles/PMC8209770/
https://europepmc.org/articles/PMC8209770/
Autor:
Yaw S. Obeng, Nhan V. Nguyen, Papa K. Amoah, Jungjoon Ahn, Mikhail Y. Shalaginov, Juejun Hu, Kathleen A. Richardson
Publikováno v:
Journal of Applied Physics. 131:075102
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d4443df88674a5a083cb2b6af317eec2
https://doi.org/10.1063/5.0080142
https://doi.org/10.1063/5.0080142
Publikováno v:
ECS Transactions. 69:79-88
This work develops a combined surface-activated bonding (SAB) technique for low-temperature SiO2-SiO2 and Cu-Cu bonding at 200 °C. The combined SAB technique involves combinations of surface activation by using surface bombardment by neutralized Ar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b44d5ff6bb5531e9c717104559f7cdb5
https://doi.org/10.1149/06906.0079ecst
https://doi.org/10.1149/06906.0079ecst
Publikováno v:
Journal of Applied Physics. 125:075706
Precise control of dopant placement is crucial for the reproducible, and reliable, nanoscale semiconductor device fabrication. In this paper, we demonstrate an atomic force microscopy (AFM) probe assisted localized doping of aluminum into an n-type s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b14efca72001a8b630887ca1eeba90f4
https://doi.org/10.1063/1.5065385
https://doi.org/10.1063/1.5065385
Publikováno v:
Proceedings of the 2015 International Conference on Microelectronic Test Structures.
A test chip to produce known and controllable gradients of surface potential and magnetic field at the chip surface and suitable for imaging with various types of scanning probe microscopes is presented. The purpose of the test chip is to evaluate va
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::610cf061d42ae8019979223442544d7d
https://doi.org/10.1109/icmts.2015.7106101
https://doi.org/10.1109/icmts.2015.7106101
Publikováno v:
Journal of Physics D: Applied Physics. 49:045502
We demonstrate the ability of the scanning microwave microscope (SMM) to detect subsurface metal lines embedded in a dielectric film with sub-micrometer resolution. The SMM was used to image 1.2 μm-wide Al–Si–Cu metal lines encapsulated with eit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::83a6793d8804a1715c535a7f741e7877
https://doi.org/10.1088/0022-3727/49/4/045502
https://doi.org/10.1088/0022-3727/49/4/045502
Autor:
Hyuk-Jae Jang, Kurt P. Pernstich, Jungjoon Ahn, Lee Richter, David J. Gundlach, Joseph J. Kopanski, Oana D. Jurchescu, Curt A. Richter
Publikováno v:
ECS Meeting Abstracts. :823-823
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e32c878eef83373307f69105bda43203
https://doi.org/10.1149/ma2013-01/19/823
https://doi.org/10.1149/ma2013-01/19/823