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Publikováno v:
Japanese Journal of Applied Physics. 49:075801
Epitaxial NiO films (epi-NiO) were successfully doped with Al by performing sequential deposition of NiO and AlO x by pulsed laser deposition. Surface morphology and crystallinity were confirmed by atomic force microscope images and X-ray diffraction
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7d66b2e5f8b81720c036edfa9f7da38a
https://doi.org/10.1143/jjap.49.075801
https://doi.org/10.1143/jjap.49.075801
