Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Jungdal Choi"'
Autor:
Bvunarvul Kim, Seungpil Lee, Beomseok Hah, Kanawoo Park, Yongsoon Park, Kangwook Jo, Yujong Noh, Hyeoncheon Seol, Hyunsoo Lee, Jaehyeon Shin, Seongjin Choi, Youngdon Jung, Sungho Ahn, Yonghun Park, Sujeong Oh, Myungsu Kim, Seonauk Kim, Hyunwook Park, Taeho Lee, Haeun Won, Minsung Kim, Cheulhee Koo, Yeonjoo Choi, Suyoung Choi, Sechun Park, Dongkyu Youn, Junyoun Lim, Wonsun Park, Hwang Hur, Kichang Kwean, Hongsok Choi, Woopyo Jeong, Sungyong Chung, Jungdal Choi, Seonyong Cha
Publikováno v:
2023 IEEE International Solid- State Circuits Conference (ISSCC).
Autor:
Wanik Cho, Jongseok Jung, Jongwoo Kim, Junghoon Ham, Sangkyu Lee, Yujong Noh, Dauni Kim, Wanseob Lee, Kayoung Cho, Kwanho Kim, Heejoo Lee, Sooyeol Chai, Eunwoo Jo, Hanna Cho, Jong-Seok Kim, Chankeun Kwon, Cheolioona Park, Hveonsu Nam, Haeun Won, Taeho Kim, Kyeonghwan Park, Sanghoon Oh, Jinhyun Ban, Junyoung Park, Jaehyeon Shin, Taisik Shin, Junseo Jang, Jiseong Mun, Jehyun Choi, Hyunseung Choi, Suna-Wook Choi, Wonsun Park, Dongkvu Yoon, Minsu Kim, Junvoun Lim, Chiwook An, Hyunyoung Shirr, Haesoon Oh, Haechan Park, Sungbo Shim, Hwang Huh, Honasok Choi, Seungpil Lee, Jaesuna Sim, Kichana Gwon, Jumsoo Kim, Woopyo Jeong, Jungdal Choi, Kyo-Won Jin
Publikováno v:
2022 IEEE International Solid- State Circuits Conference (ISSCC).
Publikováno v:
2011 3rd IEEE International Memory Workshop (IMW); 2011, p1-4, 4p
Autor:
Byungkyu Cho, ChangHyun Lee, Kwangsoo Seol, Sunghoi Hur, Jungdal Choi, Jeonghyuk Choi, Chilhee Chung
Publikováno v:
2011 3rd IEEE International Memory Workshop (IMW); 2011, p1-4, 4p
Publikováno v:
2009 IEEE International Electron Devices Meeting (IEDM); 2009, p1-4, 4p
Autor:
Changseok Kang, Jungdal Choi, Jaesung Sim, Changhyun Lee, Yoocheol Shin, Jintaek Park, Jongsun Sel, Sanghun Jeon, Youngwoo Park, Kinam Kim
Publikováno v:
2007 IEEE International Reliability Physics Symposium Proceedings 45th Annual; 2007, p167-170, 4p
Autor:
Youngwoo Park, Jungdal Choi, Changseok Kang, Changhyun Lee, Yuchoel Shin, Bonghyn Choi, Juhung Kim, Sanghun Jeon, Jongsun Sel, Jintaek Park, Kihwan Choi, Taehwa Yoo, Jaesung Sim, Kinam Kim
Publikováno v:
2006 International Electron Devices Meeting; 2006, p1-4, 4p
Autor:
Yoocheol Shin, Jungdal Choi, Changseok Kang, Changhyun Lee, Ki-Tae Park, Jang-Sik Lee, Jongsun Sel, Kim, V., Byeongin Choi, Jaesung Sim, Dongchan Kim, Hag-ju Cho, Kinam Kim
Publikováno v:
IEEE International Electron Devices Meeting, 2005. IEDM Technical Digest; 2005, p327-330, 4p
Publikováno v:
IEEE VLSI-TSA International Symposium on VLSI Technology, 2005. (VLSI-TSA-Tech); 2005, p88-94, 7p
Publikováno v:
IEEE Transactions on Electron Devices; Jan2008, Vol. 55 Issue 1, p404-410, 7p