Zobrazeno 1 - 10
of 231
pro vyhledávání: '"Jung-Yun Choi"'
Autor:
Jung-Yun Choi, Kyu-Min Han, Dongkyu Kim, Beom-Hee Lee, Han-Wook Yoo, Jin-Ho Choi, Yong-Mahn Han
Publikováno v:
International Journal of Molecular Sciences, Vol 18, Iss 12, p 2591 (2017)
Cardiofaciocutaneous (CFC) syndrome is a rare genetic disorder caused by mutations in the extracellular signal-regulated kinase (ERK) signaling. However, little is known about how aberrant ERK signaling is associated with the defective bone developme
Externí odkaz:
https://doaj.org/article/dc2eeb3c2d6249309292deb93c9a03e5
Publikováno v:
IEEE Access, Vol 11, Pp 70691-70697 (2023)
This study presents an accurate model for non-monotonic layout-dependent effects (LDEs) measured using 10nm-class dynamic random access memory technology. To collect the LDE measurement data, a test module with an individually addressable array of 24
Externí odkaz:
https://doaj.org/article/802034941a074fac9afd70eed62da185
Autor:
Jung Yun Choi, Sueen Sohn
Publikováno v:
The Korean Journal of Sports Medicine. 41:11-18
Autor:
Jung-yun Choi
Publikováno v:
THE JOURNAL OF HUMANITIES STUDIES. 129:235-256
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:1929-1942
Near-threshold computing is essential for energy-efficient operation of VLSI systems, but wide performance variation and nonlinearity to process variations block the proliferation. To cope with this, in this paper, we propose a holistic hardware perf
Autor:
Min-Chul Han, Chang-Hun Ko, Cheol-Hwan Kim, Masayuki Terai, Hye-Sun Kim, Oh-Hun Kwon, Ji-Hyun Cheon, Jin-Woo Choi, Jung-Hoon Park, Kyu-Sul Park, Jae-Ho Pak, Do-Youn Park, Seung-Yeol Oh, Min-Su Kim, Hyun-Woo Ryoo, Myung-Chul Shin, Bo-Tak Lim, Il-Mok Park, Hyuck-Joon Kwon, Yoon-Jong Song, Jung-Yun Choi, Gwan-Hyeob Koh, Hyung-Jong Ko, Yu-Gyun Shin
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
Autor:
Jung-yun Choi
Publikováno v:
THE JOURNAL OF HUMANITIES STUDIES. 123:377-396
Autor:
Jiseong Jeong, Chang-Hun Ko, Seung-Eun Yu, Oh-Hun Kwon, Tae-Hyeong Ku, Tae Heon Kim, Dong-Won Lim, Bo-Tak Lim, Hyuck-Joon Kwon, Jung-Yun Choi, Hyung-Jong Ko
Publikováno v:
Metrology, Inspection, and Process Control XXXVI.
Autor:
Cheol-Hwan Kim, Jong-Min Lee, Ji-Chang Sim, Sang-Eun Go, Hyo-Seok Woo, Dong-Yun Kim, Oh-Hun Kwon, Bo-Tak Lim, Jae-Sun Yun, Hong-Soo Kim, Hyuck-Joon Kwon, Jung-Yun Choi, Hyung-Jong Ko
Publikováno v:
DTCO and Computational Patterning.
Publikováno v:
Studies in Linguistics. 59:47-75