Zobrazeno 1 - 10
of 76
pro vyhledávání: '"Jung-Yeal Lee"'
Publikováno v:
Korean Artificial Intelligence. 5:10-17
Publikováno v:
Applied Surface Science. 257:7516-7520
Effects of different annealing atmospheres on the surface and microstructural properties of ZnO thin films grown on Si (1 0 0) substrates were investigated. X-ray diffraction results showed that the crystallinity of the ZnO thin film annealed in an o
Publikováno v:
Journal of Alloys and Compounds. 509:3132-3135
ZnO nanocrystals embedded in an amorphous Zn 2 x Si 1− x O 2 layer inserted between a ZnO thin film and a p-Si (1 0 0) substrate were formed by magnetron sputtering and thermal annealing. High-resolution transmission electron microscopy (HRTEM) ima
Autor:
Tae-Hoon Yoon, Dong Hae Suh, Jung Yeal Lee, Seong Ryong Lee, Chul Gyu Jhun, Jae Chang Kim, Jeong Dong Noh
Publikováno v:
Japanese Journal of Applied Physics. 45:2683-2688
We propose an overdriving method by double-pulse scan (DPS) within each subframe time. We applied this method to a field-sequential color (FSC) driving of a thin-film-transistor liquid crystal display (TFT-LCD) in the optically compensated bend (OCB)
Publikováno v:
Journal of Materials Science. 40:3843-3846
Many investigations on ordered phases in various III–V ternary compound semiconductor epilayers have been performed during past many years [1–10]. Among the various kinds of the ordering structures, a CuPttype superstructure has been the most ext
Publikováno v:
Journal of Materials Science Letters. 22:1263-1267
Publikováno v:
Journal of Applied Physics. 91:1166-1170
Influence of strain relaxation on structural and optical properties of the InGaN/GaN multiple quantum wells (MQWs) with high indium composition grown by metalorganic chemical vapor deposition was investigated. From photoluminescence and transmission
Publikováno v:
Journal of Crystal Growth. 233:667-672
Structural properties of Si and Mg doped and undoped Al 0.13 Ga 0.87 N layers grown on sapphire substrates by metalorganic chemical vapor deposition were studied using high-resolution X-ray diffraction (HRXRD) and transmission electron microscopy. Fo
Autor:
T.-V. Humg, M. S. Jo, S. J. Son, S.-R. Jeon, Jung-Yeal Lee, Hyung Koun Cho, G. M. Yang, S. W. Hwang
Publikováno v:
physica status solidi (a). 188:163-166
We have investigated the characteristics of InGaN/GaN blue light-emitting diodes (LEDs) with a Si 6-doped GaN contact layer. The Si 6-doping of the GaN contact layer in the devices could enhance the Si doping concentration and improve the lateral con
Publikováno v:
Journal of the Society for Information Display. 9:155-160
Several TFT-LCD devices exhibiting high image quality have been developed and commercialized, overcoming the narrow viewing-angle characteristics of conventional twisted-nematic (TN) devices. Nevertheless, no single device dominates large-sized TFT-L