Zobrazeno 1 - 8
of 8
pro vyhledávání: '"JunZhi Sang"'
Autor:
DongXu Wang, BingCheng Huai, Xing Ma, BaiMing Jin, YuGuang Wang, MengYu Chen, JunZhi Sang, RuiNan Liu
Publikováno v:
BMC Medical Education, Vol 24, Iss 1, Pp 1-13 (2024)
Abstract Background In medical imaging courses, due to the complexity of anatomical relationships, limited number of practical course hours and instructors, how to improve the teaching quality of practical skills and self-directed learning ability ha
Externí odkaz:
https://doaj.org/article/66b65c03f1b84c38bef9d571cbdabb31
Autor:
Junzhi Sang1, Chunpeng Yang1, Haiyan Liu1, Manli Zhang1, Yang Xiao1, Jinfeng Li1, Guangwei Li1 lgwsci@163.com
Publikováno v:
Tropical Journal of Pharmaceutical Research. Oct2024, Vol. 23 Issue 10, p1653-1661. 9p.
Publikováno v:
Advances in Education, Humanities and Social Science Research. 1:251
Objective: To investigate the effect of micro assistant combined with image storage and transmission system based virtual imaging system in medical imaging internship teaching. Methods: a total of 61 imaging professional students who entered the Depa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5877e5ba31f38e51a7589941d8616226
https://doi.org/10.56028/aehssr.3.1.251
https://doi.org/10.56028/aehssr.3.1.251
Publikováno v:
Molecular Medicine Reports
Dysregulated circular RNAs (circRNAs) are involved in the carcinogenesis and progression of multiple human malignancies. Knowledge of circRNAs in glioma (GM) is limited and further study to uncover new therapeutic targets for GM is urgently required.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0b4dc6903940921318c0f5db0bd9063c
https://doi.org/10.3892/mmr.2021.11894
https://doi.org/10.3892/mmr.2021.11894
Publikováno v:
Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3736f6810fa5aec800348604db44cf2c
https://doi.org/10.1109/ipfa.2014.6898180
https://doi.org/10.1109/ipfa.2014.6898180
Publikováno v:
Systems and Computers in Japan. 32:36-44
In this paper, we propose an enhanced fault model to increase coverage in detecting physical faults in LSI. First, as an alternative to the single stuck-at fault model, we propose the “single gate logical fault with Hamming distance 1” (SGLFH1) m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b8466e346088976a0f66562ac41bbc8
https://doi.org/10.1002/scj.1032
https://doi.org/10.1002/scj.1032
Publikováno v:
Asian Test Symposium
This paper presents a logical fault model, the single gate logical fault with Hamming distance 1 (HISGLF) model, designed to enhance the defect coverage of test sets. Although some characteristics of the HISGLF model are similar to those of the singl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3013237231e471d426c47fb2c28367b8
https://doi.org/10.1109/ats.1998.741598
https://doi.org/10.1109/ats.1998.741598
Conference
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