Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Jun Sik Jeoung"'
Publikováno v:
Journal of the American Ceramic Society. Aug2001, Vol. 84 Issue 8, p1859. 6p. 7 Charts, 11 Graphs.
Publikováno v:
Thin Solid Films. 476:303-311
The effects of the processing conditions on the formation of buried oxide (BOX) layers in low-dose low-energy separation by implanted oxygen materials were investigated by using infrared spectroscopy and transmission electron microscopy. In as-implan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::429d4bd0a4502d452a06ffb729a4a62b
https://doi.org/10.1016/j.tsf.2004.10.006
https://doi.org/10.1016/j.tsf.2004.10.006
Publikováno v:
Journal of the American Ceramic Society. 84:1859-1864
The effect of the oxidation state of iron on the phase separation of xNa 2 O.(100- x)SiO 2 glasses, x = 18.56 and 13, containing 0.5 mol% Fe 2 O 3 was studied. The oxidation state of iron in the glasses was varied by changing the melting conditions,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4577e18aaf3420008dbaf6a2b1a76cf7
https://doi.org/10.1111/j.1151-2916.2001.tb00927.x
https://doi.org/10.1111/j.1151-2916.2001.tb00927.x
Publikováno v:
Journal of Materials Research. 18:2177-2187
Thin separation by implanted oxygen substrates are attractive candidates for low-power, low-voltage electronic devices and can be obtained by low-dose, low-energy oxygen–ion implantation. We report in this study a variation of the process parameter
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8df03f79ab2eba838b363976e028f5ed
https://doi.org/10.1557/jmr.2003.0304
https://doi.org/10.1557/jmr.2003.0304
Autor:
Ravi K. Kukkadapu, W.Howard Poisl, Gary L. Smith, Jun-Sik Jeoung, Hong Li, Michael C. Weinberg, Jarrod V. Crum
Publikováno v:
Journal of Non-Crystalline Solids. 317:301-318
Local environments of ferric and ferrous irons were systematically studied with Mossbauer (at liquid helium temperature) and ultraviolet–visible–near infrared spectroscopic methods for various 18Na2O–72SiO2 glasses doped with 0.5 mol% Fe2O3. Th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::383e5121e9557c2a38b894a9d192e78c
https://doi.org/10.1016/s0022-3093(02)01815-x
https://doi.org/10.1016/s0022-3093(02)01815-x
Publikováno v:
Journal of Materials Science: Materials in Electronics. 13:303-308
The microstructural changes that occur during annealing of ultra-thin oxygen-implanted silicon-on-insulator have been studied using transmission electron microscopy (TEM), Rutherford backscattering spectrometry (RBS), and Auger electron spectroscopy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2aac82c60565a4ffbe32abbf1120d080
https://doi.org/10.1023/a:1015528226182
https://doi.org/10.1023/a:1015528226182
Publikováno v:
MRS Proceedings. 716
The microstructure of ultra-thin SIMOX depends strongly on implantation dose, energy and annealing conditions. We used TEM combined with AES and RBS to determine the microstructural evolution of SIMOX wafers subjected to various temperatures during a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8d413d27fa1374f1e5fb610b2d954c6c
https://doi.org/10.1557/proc-716-b1.2
https://doi.org/10.1557/proc-716-b1.2
Publikováno v:
Microscopy and Microanalysis. 9:504-505
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bd0535562205d8818ea273d95649570e
https://doi.org/10.1017/s1431927603442529
https://doi.org/10.1017/s1431927603442529
Publikováno v:
Microscopy and Microanalysis. 7:562-563
Silicon-on-insulator (SOI) is becoming a key technology for low power electronics due to substantially reduced power consumption of electronic components, and a capability of compact circuit design which are not readily achievable in bulk silicon tec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d512554348637b1be0d7bd8a40f55dcd
https://doi.org/10.1017/s1431927600028889
https://doi.org/10.1017/s1431927600028889
Publikováno v:
Journal of Materials Research; Sep2003, Vol. 18 Issue 9, p2177, 11p, 5 Diagrams, 1 Chart, 5 Graphs