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pro vyhledávání: '"Jun Cui. Kristian Andreini"'
Autor:
Wenwu Zhang, Glenn Bindley, Masako Yamada, Nitin Garg, Steven Robert Hayashi, J. Eric Tkaczyk, Gerhardt Schweinert, Henry Chen, Jun Cui. Kristian Andreini, Haochuan Jiang
Publikováno v:
2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC).
Electrical measurements of sidewall leakage are used to quantify the degree of sub-surface damage created by cutting CZT. High leakage is found at freshly cut surfaces but not at control surfaces. Dramatic reduction of leakage is demonstrated by subs
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b0f3c25cb319ed7fed862cb2ed0f8df9
https://doi.org/10.1109/nssmic.2009.5402246
https://doi.org/10.1109/nssmic.2009.5402246
