Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Jun'ichi Tsukajima"'
Publikováno v:
Catalysis Letters. 20:159-168
A new apparatus to obtain information on local structures and chemical states of solid surfaces has been constructed, with which we measure electron energy-loss fine structures (EELFS), excited by electrons of a few keV incident at a grazing angle. W
Autor:
K. Tokunaga, T. Yikegaki, K. Arai, A. Kashiwagi, T. Fujikawa, Jun'ichi Tsukajima, Toshinori Hayashi, S. Usami, S. Takatoh, Toshihiko Suzuki, Toru Enokijima
Publikováno v:
Thin Solid Films. :318-320
Nitrogen K-edge electron energy loss near-edge structure (ELNES) spectra of thin SiN x films were measured with a small scattering angle in the reflection mode for the first time. The SiNx films were formed by low pressure chemical vapour deposition
Autor:
Seiji Usami, Toshinori Hayashi, Shuji Takatoh, Tetsurou Yikegaki, Takashi Fujikawa, Kiyoaki Araki, Jun'ichi Tsukajima, Kiichi Takamoto, Toru Futami, Yoshifumi Kurihara, Toru Enokijima
Publikováno v:
Applied Physics Letters. 66:25-27
A reflection electron energy loss spectroscopy system has been developed to investigate local surface atomic structures around light elements such as C, N, and O. Electrons scattered inelastically on a surface with a small scattering angle are energy
Autor:
T. Yikegaki, Jun'ichi Tsukajima, Seiji Usami, Toshinori Hayashi, Takashi Fujikawa, K. Arai, S. Takatoh, Toru Enokijima
Publikováno v:
Physica B: Condensed Matter. :245-246
The carbon K-edge EELFS, AES and LEED are measured for the carbidic and the graphitic carbons on Ni(1 1 1) and Ni (1 0 0) surfaces. The nearest neighbor CC distance 1.44 A obtained from EXELFS for graphitic carbon on Ni(1 1 1) is in good agreement
Autor:
Jun'ichi Tsukajima, Tetsurou Yikegaki, Kiyoaki Araki, Seiji Usami, Shuji Takatoh, Takashi Fujikawa, Toru Enokijima, Toshinori Hayashi
Publikováno v:
Japanese Journal of Applied Physics. 32:182
The oxygen K-edge electron energy -loss near-edge structure (ELNES) spectra for NiO and O/Ni(100) system have been measured by using the reflection mode of small-angle scattering. Through comparison between the ELNES and the XANES for NiO, we find th
Autor:
Kiyoaki Araki, Toshinori Hayashi, Takashi Fujikawa, Shuji Takatoh, Toru Enokijima, Tetsurou Yikegaki, Jun'ichi Tsukajima
Publikováno v:
Japanese Journal of Applied Physics. 32:73
The reflection mode EELFS is theoretically investigated. In particular, selection rule and the anisotropy of EELFS are discussed based on the basic EELFS theory developed by one of the authors. In a small angle scattering the dipole selection rule is