A model for Scan Insertion at The Register Transfert Level

Autor: Zaourar, Lilia, Kieffer, Yann, Aktouf, Chouki, Julliard, Vincent

Publikováno v: The Tenth IEEE Workshop on RTL and High Level Testing
The Tenth IEEE Workshop on RTL and High Level Testing, Nov 2009, Hong Kong, Hong Kong SAR China. pp.185

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::029de29473f6826ebb4005584f5af762
https://hal.archives-ouvertes.fr/hal-00440315