Zobrazeno 1 - 10
of 41
pro vyhledávání: '"Julius Hållstedt"'
Autor:
Julius Hållstedt, Emil Espes
Publikováno v:
Acta Crystallographica Section A Foundations and Advances. 78:a62-a62
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2623b1514a17fad1eff675d86d35a6b5
https://doi.org/10.1107/s2053273322099375
https://doi.org/10.1107/s2053273322099375
Autor:
Julius Hållstedt, E. Espes
Publikováno v:
Acta Crystallographica Section A Foundations and Advances. 77:C774-C774
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5a510780ce7453deabc8c24137f22bd7
https://doi.org/10.1107/s0108767321089236
https://doi.org/10.1107/s0108767321089236
Autor:
Anasuya Adibhatla, Julius Hållstedt
Publikováno v:
Acta Crystallographica Section A Foundations and Advances. 77:a5-a5
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8b1324fd067e8dff19a72412b354f777
https://doi.org/10.1107/s0108767321099943
https://doi.org/10.1107/s0108767321099943
Publikováno v:
Microscopy and Microanalysis. 26:1572-1572
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a5b6067d55f7369375eb5e869936a074
https://doi.org/10.1017/s1431927620018577
https://doi.org/10.1017/s1431927620018577
Publikováno v:
2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
Front end X-ray metrology applications based on diffraction, scattering or fluorescence such as HRXRD, XRR, CD-SAXS or μXRF rely heavily on the x-ray source brightness for metrology throughput and accuracy. Similarly, high end X-ray imaging applicat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::51e46fb6675c1795a2db7c4822533b29
https://doi.org/10.1109/asmc.2018.8373176
https://doi.org/10.1109/asmc.2018.8373176
Autor:
Tomi Tuohimaa, Anasuya Adibhatla, Fei Yang, Ulf Lundström, Julius Hållstedt, Mikael Otendal, Daniel H. Larsson
Publikováno v:
Microscopy and Microanalysis. 24:318-319
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2edacfd362643138e8911d01f1e9b732
https://doi.org/10.1017/s1431927618013909
https://doi.org/10.1017/s1431927618013909
Autor:
Emil Espes, Julius Hållstedt
Publikováno v:
Acta Crystallographica Section A Foundations and Advances. 75:e632-e632
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2a1236c67de3de1d4cced5ef0528eb5f
https://doi.org/10.1107/s2053273319089241
https://doi.org/10.1107/s2053273319089241
Autor:
Julius Hållstedt, Emil Espes
Publikováno v:
Acta Crystallographica Section A Foundations and Advances. 75:e28-e28
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d97057376faf1e9a6d69f353850b521a
https://doi.org/10.1107/s2053273319095287
https://doi.org/10.1107/s2053273319095287
Publikováno v:
Acta Crystallographica Section A Foundations and Advances. 75:a39-a39
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cecf5ecf2691006f709c84fca3b84395
https://doi.org/10.1107/s0108767319099604
https://doi.org/10.1107/s0108767319099604
Autor:
Tomi Tuohimaa, Anasuya Adibhatla, Per Takman, Julius Hållstedt, Ulf Lundström, Oscar Hemberg, Mikael Otendal
Publikováno v:
Acta Crystallographica Section A Foundations and Advances. 75:a27-a27
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b3935d9e520359d360b38442947afa2
https://doi.org/10.1107/s0108767319099720
https://doi.org/10.1107/s0108767319099720