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pro vyhledávání: '"Julien Guilleau-Tavernier"'
Autor:
Vincenzo Della Marca, Julien Guilleau-Tavernier, Pierre Laine, Franck Melul, Marc Bocquet, Thibault Kempf, Loic Welter, Jean-Michel Moragues, Arnaud Regnier, Jean-Michel Portal
Publikováno v:
IEEE 34th International Conference on Microelectronic Test Structures (ICMTS 2022)
IEEE 34th International Conference on Microelectronic Test Structures (ICMTS 2022), Mar 2022, Cleveland, OH, United States. pp.1-4, ⟨10.1109/ICMTS50340.2022.9898189⟩
IEEE 34th International Conference on Microelectronic Test Structures (ICMTS 2022), Mar 2022, Cleveland, OH, United States. pp.1-4, ⟨10.1109/ICMTS50340.2022.9898189⟩
International audience; In this paper we present a full free addressable 4kb EEPROM memory array. This test structure based on CAST vehicle has been upgraded with flexible addressing logic to select any numbers of cells on single or multiple word lin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b65d098c07707378de9ed09aa24a956b
https://hal.science/hal-04063478/file/paper_ICMTS_2022_5.3_della_marca.pdf
https://hal.science/hal-04063478/file/paper_ICMTS_2022_5.3_della_marca.pdf
