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Publikováno v:
Image Analysis and Stereology, Vol 36, Iss 1, Pp 5-13 (2017)
Parametric tessellation models are often used to approximate complex grain morphologies of polycrystalline microstructures. A big advantage of such models is the substantial reduction in disk space required to store large, three-dimensional data sets
Externí odkaz:
https://doaj.org/article/bcdc509394b2477ebf46d63d9ba13b5e