Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Juergen Schmerberg"'
Autor:
Manish Sharma, Sergej Schwarz, Yuan-Shih Chen, Feng-Ming Kuo, Michael Brennan, James Yeh, Ting-Pu Tai, Kathy Yang, Alan Ma, Juergen Schmerberg, Cheng-Yiing Chuang
Publikováno v:
International Symposium for Testing and Failure Analysis.
Logic diagnosis analyzes scan test failures and produces a list of potential defect locations and types. This information is often used as a starting point for a detailed physical failure analysis (PFA) process that locates the actual physical defect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ee20a340c41ab1fc0efee55afa10428
https://doi.org/10.31399/asm.cp.istfa2011p0086
https://doi.org/10.31399/asm.cp.istfa2011p0086
This title features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect
Autor:
ASM International, International Symposium for Testing and Failure Analysis/2011, Electronic Device Failure Analysis Society
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detec