Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Juergen Koeble"'
Autor:
Juergen Koeble, Michael Huth
Publikováno v:
Materials Science Forum. :137-140
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e853cd9b3f7876d9fc38e9bdf6939142
https://doi.org/10.4028/www.scientific.net/msf.373-376.137
https://doi.org/10.4028/www.scientific.net/msf.373-376.137
QPlus: atomic force microscopy on single-crystal insulators with small oscillation amplitudes at 5 K
Publikováno v:
Nanotechnology. 20:264009
Based on a proven low temperature scanning tunneling microscope (STM) platform, we have integrated a QPlus sensor, which employs a quartz tuning fork for force detection in non-contact atomic force microscopy (AFM). For combined STM operation, this s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::40af609cc4cba7020eb2092f21f02800
https://doi.org/10.1088/0957-4484/20/26/264009
https://doi.org/10.1088/0957-4484/20/26/264009
Publikováno v:
Nanotechnology; Jun2009, Vol. 20 Issue 26, p264009-264009, 1p