Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Juan S. Cachaya"'
Publikováno v:
Ingeniería e Investigación, Vol 43, Iss 1, Pp e94361-e94361 (2022)
It is a customary practice to carry out standardless elemental microanalysis by energy dispersive spectroscopy (EDS) under the very same operational conditions as those used for scanning electron microscope (SEM) imaging. In this article, EDS experim
Externí odkaz:
https://doaj.org/article/619bff5ef8b643bdb0b0a4e240c80ac1
Autor:
Juan P.N. Cruz, Carlos M. Garzón, Johan K. Noreña, Fabian Pineda, Juan. S. Cachaya, Abel A.C. Recco
Publikováno v:
Micron. 154:103204
Energy dispersive spectroscopy (EDS) experiments were carried out in the scanning electron microscope (SEM) on top of either stainless steel (SS), silicon or glass substrates covered with TiN nitride coatings. The nominal coating thicknesses were 0.4
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8bfa6c9fc0d30fa62acb6ed2bb3b1953
https://doi.org/10.1016/j.micron.2021.103204
https://doi.org/10.1016/j.micron.2021.103204