Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Juan M. Trujillo-Sevilla"'
Autor:
Carolina Belda-Para, Gonzalo Velarde-Rodríguez, José G. Marichal-Hernández, Miriam Velasco-Ocaña, Juan M. Trujillo-Sevilla, Nicolas Alejandre-Alba, José M. Rodríguez-Ramos
Publikováno v:
Scientific Reports, Vol 14, Iss 1, Pp 1-13 (2024)
Abstract This study aims to evaluate the applicability of the high-resolution WaveFront Phase Imaging Sensor (WFPI) in eyes with Fuchs’ Endothelial Corneal Dystrophy (FECD) through qualitative and quantitative analysis using a custom-designed Autom
Externí odkaz:
https://doaj.org/article/e09be8af68a1450abc542c23a333d305
Autor:
Carolina Belda-Para, Gonzalo Velarde-Rodríguez, Miriam Velasco-Ocaña, Juan M. Trujillo-Sevilla, Iván Rodríguez-Méndez, Javier Rodríguez-Martin, Nicolas Alejandre-Alba, Silvia Rodríguez-García, José M. Rodríguez-Ramos
Publikováno v:
Scientific Reports, Vol 14, Iss 1, Pp 1-10 (2024)
Abstract The aim of this work is to quantitatively assess the wavefront phase of keratoconic eyes measured by the ocular aberrometer t·eyede (based on WaveFront Phase Imaging Sensor), characterized by a lateral resolution of 8.6 µm without requirin
Externí odkaz:
https://doaj.org/article/0ab70b3076cb46bbab1094bb8386a78b
Autor:
Gonzalo Velarde-Rodriguez, Carolina Belda-Para, Miriam Velasco-Ocaña, Juan M. Trujillo-Sevilla, Javier Rodríguez-Martin, Ignacio Jiménez-Alfaro, José M. Rodriguez-Ramos, Nicolas Alejandre-Alba
Publikováno v:
Ophthalmology and Therapy, Vol 12, Iss 3, Pp 1569-1582 (2023)
Abstract Introduction This study performs optical aberration assessment in patients using a novel ultra-high-resolution device. The objective of this study is to analyze optical aberrations, especially the very high order wavefront (more than 10th or
Externí odkaz:
https://doaj.org/article/37001161e7c34e2ab04b53e27a72dae0
Autor:
Sergio Bonaque-González, Juan M. Trujillo-Sevilla, Miriam Velasco-Ocaña, Óscar Casanova-González, Miguel Sicilia-Cabrera, Alex Roqué-Velasco, Sabato Ceruso, Ricardo Oliva-García, Javier Martín-Hernández, Oscar Gomez-Cardenes, José G. Marichal-Hernández, Damien Gatinel, Jack T. Holladay, José M. Rodríguez-Ramos
Publikováno v:
Scientific Reports, Vol 11, Iss 1, Pp 1-12 (2021)
Abstract Ocular optics is normally estimated based on up to 2,600 measurement points within the pupil of the eye, which implies a lateral resolution of approximately 175 µm for a 9 mm pupil diameter. This is because information below this resolution
Externí odkaz:
https://doaj.org/article/8b86b09577a1463e973c7a05b6a10f74
Autor:
Ricardo Oliva-García, Carlos Cairós, Juan M. Trujillo-Sevilla, Miriam Velasco-Ocaña, José Manuel Rodríguez-Ramos
Publikováno v:
Sensors, Vol 23, Iss 15, p 6651 (2023)
We have designed, assembled, and evaluated a compact instrument capable of capturing the wavefront phase in real time, across various scenarios. Our approach simplifies the optical setup and configuration, which reduces the conventional capture and c
Externí odkaz:
https://doaj.org/article/06b62888ae2e43b69737d18c264d9845
Publikováno v:
Applied Sciences, Vol 12, Iss 18, p 9049 (2022)
In the current study, an improved method to obtain measurements of geometry of silicon wafers capable of removing the effect induced by gravity and the contact of supports is presented. The classical method only requires two measurements, while the p
Externí odkaz:
https://doaj.org/article/d4b807fb68b24cacab80a76aff632fa1
Autor:
Juan M. Trujillo-Sevilla, Óscar Casanova-González, Alex Roqué-Velasco, Miguel Jesús Sicilia, Jose Manuel Ramos-Rodríguez, Jan O. Gaudestad
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
Autor:
Juan M. Trujillo-Sevilla, Óscar Casanova-González, Alex Roqué-Velasco, Javier González Pardo, José Manuel Ramos-Rodríguez, Jan O. Gaudestad
Publikováno v:
Photonic Instrumentation Engineering X.
Autor:
Juan M. Trujillo-Sevilla, Alex Roqué-Velasco, Miguel Jesús Sicilia, Óscar Casanova-González, Jose Manuel Ramos-Rodríguez, Jan O. Gaudestad
Publikováno v:
Emerging Imaging and Sensing Technologies for Security and Defence VII.
Autor:
Juan M. Trujillo-Sevilla, Óscar Gómez-Cárdenes, Alex Roqué-Velasco, Miguel A. Sicilia, Javier González Pardo, José Manuel Ramos-Rodríguez, Jan O. Gaudestad
Publikováno v:
International Conference on Extreme Ultraviolet Lithography 2022.