Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Juan Jose Aguilar Martin"'
MESIC VSelected, peer reviewed papers from the 5th International Conference of Manufacturing Engineering Society (MESIC 2013), June 26-28, 2013, Zaragoza, Spain
MESIC VSelected, peer reviewed papers from the 5th International Conference of Manufacturing Engineering Society (MESIC 2013), June 26-28, 2013, Zaragoza, Spain
Autor:
Vignesh Sampath, Inaki Maurtua, Juan Jose Aguilar Martin, Andoni Rivera, Jorge Molina, Aitor Gutierrez
Surface defect identification is an essential task in the industrial quality control process, in which visual checks are conducted on a manufactured product to ensure that it meets quality standards. Convolutional Neural Network (CNN) based surface d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::02e1ea24968ad4e8ec9d74b4b8e59c63
http://zaguan.unizar.es/record/125361
http://zaguan.unizar.es/record/125361
Autor:
Vignesh Sampath, Inaki Maurtua, Juan Jose Aguilar Martin, Ander Iriondo, Iker Lluvia, Andoni Rivera
Publikováno v:
2022 International Conference on Electrical, Computer and Energy Technologies (ICECET).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0008f8c40d17dde8c4e726ddb71ce694
https://doi.org/10.1109/icecet55527.2022.9872566
https://doi.org/10.1109/icecet55527.2022.9872566
Publikováno v:
Journal of Big Data, Vol 8, Iss 1, Pp 1-59 (2021)
Abstract Any computer vision application development starts off by acquiring images and data, then preprocessing and pattern recognition steps to perform a task. When the acquired images are highly imbalanced and not adequate, the desired task may no
Externí odkaz:
https://doaj.org/article/c734fd8f5ee440aaa961752138de0845
Autor:
Vignesh Sampath, Iñaki Maurtua, Juan José Aguilar Martín, Ander Iriondo, Iker Lluvia, Gotzone Aizpurua
Publikováno v:
Sensors, Vol 23, Iss 4, p 1861 (2023)
Surface defect identification based on computer vision algorithms often leads to inadequate generalization ability due to large intraclass variation. Diversity in lighting conditions, noise components, defect size, shape, and position make the proble
Externí odkaz:
https://doaj.org/article/d85a003af2424cda865df1500af2cd5b
Autor:
Tingting Chen, Vignesh Sampath, Marvin Carl May, Shuo Shan, Oliver Jonas Jorg, Juan José Aguilar Martín, Florian Stamer, Gualtiero Fantoni, Guido Tosello, Matteo Calaon
Publikováno v:
Applied Sciences, Vol 13, Iss 3, p 1903 (2023)
While attracting increasing research attention in science and technology, Machine Learning (ML) is playing a critical role in the digitalization of manufacturing operations towards Industry 4.0. Recently, ML has been applied in several fields of prod
Externí odkaz:
https://doaj.org/article/d68ccbd963e74d07a6c405ea8841e24e
Publikováno v:
Sensors, Vol 14, Iss 1, Pp 606-633 (2014)
During the last years, the use of Portable Coordinate Measuring Machines (PCMMs) in industry has increased considerably, mostly due to their flexibility for accomplishing in-line measuring tasks as well as their reduced costs and operational advantag
Externí odkaz:
https://doaj.org/article/e91492f44ad24cc280efde87af398196