Zobrazeno 1 - 10
of 23
pro vyhledávání: '"Juan José Aguilar Martín"'
Autor:
Vignesh Sampath, Iñaki Maurtua, Juan José Aguilar Martín, Ander Iriondo, Iker Lluvia, Gotzone Aizpurua
Publikováno v:
Sensors, Vol 23, Iss 4, p 1861 (2023)
Surface defect identification based on computer vision algorithms often leads to inadequate generalization ability due to large intraclass variation. Diversity in lighting conditions, noise components, defect size, shape, and position make the proble
Externí odkaz:
https://doaj.org/article/d85a003af2424cda865df1500af2cd5b
Autor:
Tingting Chen, Vignesh Sampath, Marvin Carl May, Shuo Shan, Oliver Jonas Jorg, Juan José Aguilar Martín, Florian Stamer, Gualtiero Fantoni, Guido Tosello, Matteo Calaon
Publikováno v:
Applied Sciences, Vol 13, Iss 3, p 1903 (2023)
While attracting increasing research attention in science and technology, Machine Learning (ML) is playing a critical role in the digitalization of manufacturing operations towards Industry 4.0. Recently, ML has been applied in several fields of prod
Externí odkaz:
https://doaj.org/article/d68ccbd963e74d07a6c405ea8841e24e
Publikováno v:
Journal of Big Data, Vol 8, Iss 1, Pp 1-59 (2021)
Abstract Any computer vision application development starts off by acquiring images and data, then preprocessing and pattern recognition steps to perform a task. When the acquired images are highly imbalanced and not adequate, the desired task may no
Externí odkaz:
https://doaj.org/article/c734fd8f5ee440aaa961752138de0845
Publikováno v:
Sensors, Vol 14, Iss 1, Pp 606-633 (2014)
During the last years, the use of Portable Coordinate Measuring Machines (PCMMs) in industry has increased considerably, mostly due to their flexibility for accomplishing in-line measuring tasks as well as their reduced costs and operational advantag
Externí odkaz:
https://doaj.org/article/e91492f44ad24cc280efde87af398196
MESIC VSelected, peer reviewed papers from the 5th International Conference of Manufacturing Engineering Society (MESIC 2013), June 26-28, 2013, Zaragoza, Spain
MESIC VSelected, peer reviewed papers from the 5th International Conference of Manufacturing Engineering Society (MESIC 2013), June 26-28, 2013, Zaragoza, Spain
Publikováno v:
Digital.CSIC. Repositorio Institucional del CSIC
instname
instname
16 pags., 9 figs., 1 tab.
A new methodology to completely characterize active multicore waveguides is proposed. The method is applied to two-core waveguides written in an Er3+/Yb3+ co-doped phosphate glass by femtosecond laser inscription. Deter
A new methodology to completely characterize active multicore waveguides is proposed. The method is applied to two-core waveguides written in an Er3+/Yb3+ co-doped phosphate glass by femtosecond laser inscription. Deter
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7c272f141d51a4353f4b021cb32d45e5
http://hdl.handle.net/10261/258956
http://hdl.handle.net/10261/258956
Publikováno v:
Journal of Big Data
Zaguán: Repositorio Digital de la Universidad de Zaragoza
Universidad de Zaragoza
Zaguán. Repositorio Digital de la Universidad de Zaragoza
instname
Journal of Big Data, Vol 8, Iss 1, Pp 1-59 (2021)
Zaguán: Repositorio Digital de la Universidad de Zaragoza
Universidad de Zaragoza
Zaguán. Repositorio Digital de la Universidad de Zaragoza
instname
Journal of Big Data, Vol 8, Iss 1, Pp 1-59 (2021)
Any computer vision application development starts off by acquiring images and data, then preprocessing and pattern recognition steps to perform a task. When the acquired images are highly imbalanced and not adequate, the desired task may not be achi
A Strategy for Geometric Error Characterization in Multi-Axis Machine Tool by Use of a Laser Tracker
Publikováno v:
Key Engineering Materials. 615:22-31
This paper aims to present different methods of volumetric verification in long range machine toll with lineal and rotary axes using a commercial laser tracker as measurement system. This method allows characterizing machine tool geometric errors dep
Autor:
Raquel Acero Cacho, Marta Torralba, Juan José Aguilar Martín, José A. Yagüe-Fabra, Margarita Valenzuela, J.A. Albajez
Publikováno v:
Key Engineering Materials. 615:57-62
The nanotechnology field has been developing strongly in recent years and ultra-precision measuring systems are nowadays required. A new two-dimensional moving platform with 50x50 mm range of travel, nanometer resolution and sub micrometer accuracy i