Zobrazeno 1 - 10
of 11
pro vyhledávání: '"JuHoon Yoon"'
Autor:
Juhoon Yoon, Dong Su Ryu, Byong Jin Kim, YoungWoo Lee, DaeByoung Kang, GyuIck Jung, Jae Ung Lee, ChoongHoe Kim, EunNaRa Cho, JinYoung Khim, Sun-Joong Kim
Publikováno v:
Journal of the Microelectronics and Packaging Society. 23:43-48
Autor:
Juhoon Yoon, YongHo Son, SeoungJoon Hong, DaeByoung Kang, KiDong Sim, DaeHo Moon, Byong Jin Kim, JinYoung Khim
Publikováno v:
Journal of the Microelectronics and Packaging Society. 23:31-34
Autor:
Jin Young Kim, Choonheung Lee, Cha Gyu Song, Sung-Hoon Choa, Eun-Sook Sohn, Hoon Sun Jung, Juhoon Yoon, DaeByoung Kang
Publikováno v:
Nanoscience and Nanotechnology Letters. 8:1-7
Publikováno v:
Journal of the Microelectronics and Packaging Society. 22:41-45
RtMLF (Routable Molded Lead Frame) based on molded substrate has been developed to maximize advantages of both leadframe product which has high thermal and electrical performance and laminate product which accommodates more I/O count and keeps fan-in
Autor:
KwangSeok Oh, Jemmy Sutanto, Juhoon Yoon, Robert Lanzone, Ron Huemoeller, DaeByoung Kang, Michael Oh
Publikováno v:
Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT). 2013:000916-000936
This paper describes the ongoing 3 years research and development at Amkor Technology on CoC (Chip on Chip)/FtF (Face to Face) – PossumTM technology. This technology has showed a lot of interests from the microelectronics customers/industries becau
Autor:
MinJae Lee, Keun-Soo Kim, Hwankyu Kim, DaeByoung Kang, TaeKyeong Hwang, Juhoon Yoon, David Jon Hiner, Dong Wook Kim, Seokgeun Ahn
Publikováno v:
2016 IEEE 66th Electronic Components and Technology Conference (ECTC).
High throughput interconnection technology has been achieved using a multi-chip gang bonding process with an advanced chip on wafer (CoW) test vehicle (TV). The TV had 30 µm of fine-pitch copper pillar (CuP) and the bonding test was performed using
Autor:
ChoongHoe Kim, Choonheung Lee, Jin Young Kim, Yanggyoo Jung, Yunseok Song, DongSu Ryu, Minho Gim, Juhoon Yoon
Publikováno v:
2016 IEEE 66th Electronic Components and Technology Conference (ECTC).
Conventional flip chip technologies such as the mass reflow (MR) process and the thermal compression bonding (TCB) process are commonly used technologies in the micro assembly field. However, there is a continuous need for next generation interconnec
Publikováno v:
2015 IEEE 65th Electronic Components and Technology Conference (ECTC).
Advanced flip chip packaging technology supports the next generation of products with increased die complexities. The increase in complexity and functionality has been driving the need to investigate fine-pitch interconnection technology with 3D inte
Autor:
Dongjoo Park, Shengmin Wen, Choonheung Lee, Jinseong Kim, Juhoon Yoon, Byoungwoo Cho, Yesul Ahn, Gyuwan Han, Lou Nicholls
Publikováno v:
2014 IEEE 64th Electronic Components and Technology Conference (ECTC).
Due to rapid growth in the mobile industry, Package-on-Package (PoP) has been widely adopted for 3D integration of logic and memory devices within mobile handsets, and other portable multimedia products, etc. Typical PoP configuration includes a logi
Autor:
Akito Yoshida, Byoungwoo Cho, Jinseong Kim, Yesul Ahn, Dongjoo Park, Juhoon Yoon, Gyuwan Han, Choon Heung
Publikováno v:
2013 3rd IEEE CPMT Symposium Japan.
Package-on-package (PoP) has been widely adopted for 3D integration of logic and memory within mobile handsets and other portable multimedia devices. Typical PoP solution is applied to logic processor as bottom package and memory device as top packag