Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Ju Seong Kang"'
Autor:
Jaehoon Choi, Ryeo-Eun Go, Ju-Seong Kang, Young Jin Wi, Kyung-A Hwang, Kyung-Chul Choi, Min-Young Lee, Hyoung-Chin Kim, Ki-Hoan Nam, Yong-Sub Byun
Publikováno v:
Biomolecules & Therapeutics. 26:298-305
Rhomboid family member 2 gene (Rhbdf2) is an inactive homologue lacking essential catalytic residues of rhomboid intramembrane serine proteases. The protein is necessary for maturation of tumor necrosis factor-alpha (TNF-α) converting enzyme, which
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::550db6e9d08de4ef7206d0382f9db99a
https://doi.org/10.4062/biomolther.2017.103
https://doi.org/10.4062/biomolther.2017.103
Autor:
Min-Young, Lee, Ju-Seong, Kang, Ryeo-Eun, Go, Yong-Sub, Byun, Young Jin, Wi, Kyung-A, Hwang, Jae-Hoon, Choi, Hyoung-Chin, Kim, Kyung-Chul, Choi, Ki-Hoan, Nam
Publikováno v:
Biomolecules & Therapeutics
Rhomboid family member 2 gene (Rhbdf2) is an inactive homologue lacking essential catalytic residues of rhomboid intramembrane serine proteases. The protein is necessary for maturation of tumor necrosis factor-alpha (TNF-α) converting enzyme, which
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::676577fcd11428d0918c6181c9064359
https://pubmed.ncbi.nlm.nih.gov/29223140
https://pubmed.ncbi.nlm.nih.gov/29223140
Publikováno v:
ECS Transactions. 22:27-31
The bi-modal breakdown processes can well explain the lifetime model in grooved gate oxide with rounded local structure. We have clarified for the first time that the gate oxide reliability is strongly dependant on the tunneling characteristics in th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2e2b5cdae6f9d8ae4c36637568bdaeea
https://doi.org/10.1149/1.3152959
https://doi.org/10.1149/1.3152959
Autor:
Jae Yong Seo, Ju Seong Kang, Hyun Kim, Se Young Lim, Hyung-Jin Park, Noh Seok Park, Hong Sik Park, Byung Se So, Woo Sup Kim, Nam Hyun Cha
Burn-in effectiveness relies on the capability to accelerate any latent defects to failure. However the margin between operating voltages and any additional voltage that may be applied during burn-in is shrinking because the intrinsic reliability mar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::95f7877a9436d87950a4444913e394db
https://zenodo.org/record/1273822
https://zenodo.org/record/1273822
Publikováno v:
2011 IEEE 61st Electronic Components & Technology Conference (ECTC); 2011, p608-611, 4p