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pro vyhledávání: '"Joshua D. Yablonski"'
Autor:
Mark M. Moog, Travis W. LaJoie, Jason Locklin, Ian VonWald, Joshua D. Yablonski, Frank Tsui, Dean M. DeLongchamp, Wei You
Publikováno v:
The Journal of Physical Chemistry C. 122:7586-7596
The morphological, structural, and electrical properties of poly(3-methylthiophene) polymer brush films grown on indium tin oxide up to 120 nm thick are reported. Optical spectroscopy experiments indicate that the average orientation of polymer chain
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04ad6b6d6afb37f7b2419dda5a5e93a6
https://doi.org/10.1021/acs.jpcc.8b00033
https://doi.org/10.1021/acs.jpcc.8b00033
