Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Joseph Zuercher"'
Autor:
O.S. Zilova, Joseph Zuercher, Beat Neuenschwander, M.L. Shupegin, B. Jaeggi, Sergej M. Pimenov, M. Yu. Presniakov, E. V. Zavedeev
Contact-mode atomic force microscopy (AFM) techniques (lateral force microscopy, force-distance curves) are applied to study the effects of femtosecond-laser ablation and micropatterning of diamond-like nanocomposite (DLN) films (a-C:H:Si:O films) on
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::41b91233452241a0a868c071b71061e8
Publikováno v:
Physics Procedia. 12:164-171
Ablation characteristics of copper and stainless steel with laser pulses from 10 to 100 ps at 1064nm wavelength were studied. The influence of the pulse duration and the number of pulses on the threshold fluence and the penetration depth has been inv
Autor:
Beat Neuenschwander, B. Jaeggi, Karl-Heinz Selbmann, Guido Hennig, Markus Zimmermann, Urs Hunziker, Thomas Meier, Joseph Zuercher
Publikováno v:
SPIE Proceedings.
For surface and 3D structuring the ultra short pulsed laser systems are mostly used in combination with galvo scanners. This work reports on the synchronization of the scanner mirror motion with the clock of the laser pulses, which is usually in the