Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Joseph T. Scheper"'
Publikováno v:
Chemistry of Materials. 11:3490-3496
The atmospheric pressure chemical vapor deposition of titanium aluminum nitride films was accomplished using a three-precursor system comprised of titanium tetrachloride, tert-butylamine, and trimethylaluminum at a substrate temperature of 600 °C. S
Autor:
Glenn P. A. Yap, a Charles H. Winter, Kumudini C. Jayaratne, b Louise M. Liable-Sands, Arnold L. Rheingold, Joseph T. Scheper
Publikováno v:
Inorganic Chemistry. 38:4354-4360
Treatment of niobium pentachloride with cyclohexylphosphine and phenylphosphine in dichloromethane afforded octachlorotetrakis(cyclohexylphosphine)diniobium(IV) (85%) and octachlorotetrakis(phenylp...
Publikováno v:
Materials Science in Semiconductor Processing. 2:149-157
The deposition of titanium nitride films from single-source precursors bearing alkylhydrazine-derived ligands is reported. The complex [Ti2Cl4(NN(CH3)2)2(NH2N(CH3)2)2] sublimes at 140–150°C (0.1 mmHg) and affords titanium nitride films in a chemic
Autor:
b Louise M. Liable-Sands, Glenn P. A. Yap, Arnold L. Rheingold, Kumudini C. Jayaratne, a Charles H. Winter, Joseph T. Scheper
Publikováno v:
ChemInform. 30
Treatment of niobium pentachloride with cyclohexylphosphine and phenylphosphine in dichloromethane afforded octachlorotetrakis(cyclohexylphosphine)diniobium(IV) (85%) and octachlorotetrakis(phenylp...
Precursors for the Chemical Vator Deposition of Titanium Nitride and Titanium Aluminum Nitride Films
Publikováno v:
MRS Proceedings. 495
Titanium nitride and ternary alloys thereof are of significant interest due to their hardness, chemical resistance, and good electrical conductivity. We report the synthesis, structure, and properties of several new precursors to titanium nitride tha
Conference
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