Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Joseph Sloan"'
Interrogates the relationship between higher education and the carceral stateOver the last five years, headlines have thrust campus police departments from relative obscurity into the national spotlight. Campus constituents have called for campus pol
Autor:
Sergio A. Bermudez Rodriguez, Levente Klein, Alejandro G. Schrott, Joseph Sloan, Hendrik F. Hamann
Publikováno v:
Applied Physics A. 115:829-836
A novel method to measure strain without mediation of stress has been developed to assess relative displacements in art objects responding to environmental fluctuations. The method uses a chip with a variable resistor composed of a Giant Magnetic Res
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::36136d6cb7b60a1a9d4485542dd1ddf7
https://doi.org/10.1007/s00339-013-7871-4
https://doi.org/10.1007/s00339-013-7871-4
Publikováno v:
ICCD
Although a significant fraction of emerging failure and wearout mechanisms result in intermittent or permanent faults in hardware, their impact (as distinct from transient faults) on software applications has not been well studied. In this paper, we
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a33b6f15d5067cbce6b5baf91864b533
https://doi.org/10.1109/iccd.2013.6657076
https://doi.org/10.1109/iccd.2013.6657076
Publikováno v:
DSN
The increasing size and complexity of massively parallel systems (e.g. HPC systems) is making it increasingly likely that individual circuits will produce erroneous results. For this reason, novel fault tolerance approaches are increasingly needed. P
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2938db01c9261950b9eb72c035919a7a
https://doi.org/10.1109/dsn.2013.6575309
https://doi.org/10.1109/dsn.2013.6575309
Publikováno v:
DAC
Much recent research [8, 6, 7] suggests significant power and energy benefits of relaxing correctness constraints in future processors. Such processors with relaxed constraints have often been referred to as stochastic processors [10, 15, 11]. In thi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4127cbbe4033910a75e1b2209e358f1
https://doi.org/10.1145/2228360.2228524
https://doi.org/10.1145/2228360.2228524
Publikováno v:
DSN
The increasing size and complexity of High-Performance Computing systems is making it increasingly likely that individual circuits will produce erroneous results, especially when operated in a low energy mode. Previous techniques for Algorithm - Base
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::33805bc472f877fd4b7fe80673ae2aa3
https://doi.org/10.1109/dsn.2012.6263938
https://doi.org/10.1109/dsn.2012.6263938
Publikováno v:
CASES
As device sizes shrink, device-level manufacturing challenges have led to increased variability in physical circuit characteristics. Exponentially increasing circuit density has not only brought about concerns in the reliable manufacturing of circuit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d52cf0d330a1913afc574becc6932ec8
https://doi.org/10.1145/2038698.2038720
https://doi.org/10.1145/2038698.2038720
Publikováno v:
DSN
There have been several attempts at correcting process variation induced errors by identifying and masking these errors at the circuit and architecture level [10, 27]. These approaches take up valuable die area and power on the chip. As an alternativ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::64bfb1104daf13e76eabf262fb60f70e
https://doi.org/10.1109/dsn.2010.5544923
https://doi.org/10.1109/dsn.2010.5544923
Autor:
Rakesh Kumar, Joseph Sloan
Publikováno v:
CASES
As technology scales and the energy of computation continually approaches thermal equilibrium [1,2], parameter variations and noise levels will lead to larger error rates at various levels of the computation stack. The error rates would be especially
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b9e3f086c11b56547a275ff2c56114b2
https://doi.org/10.1145/1629395.1629432
https://doi.org/10.1145/1629395.1629432