Výsledky vyhledávání - "Joseph Kopanski"

(Invited) Towards the Physical Reliability of 3D-Integrated Systems: Broadband Dielectric Spectroscopic (BDS) Studies of Material Evolution and Reliability in Integrated Systems

Autor: Papa K. Amoah, Christopher E Sunday, Chukwudi Okoro, Jungjoon Ahn, Lin You, Dmitry Veksler, Joseph Kopanski, Yaw Obeng

Publikováno v: ECS Meeting Abstracts. :859-859

In this talk, we present an overview of our current research focus in developing non-destructive metrology for monitoring reliability issues in 3D-integrated electronic systems. Working closely with the semiconductor industry, we have been looking at

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9551a0fca750d1052b0000a782b864f8
https://doi.org/10.1149/ma2022-0217859mtgabs

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Accomplishments in nanotechnology

Autor: Michael T Postek, Joseph Kopanski, David Wollman

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::7997fe688ecf9c6d60827a1e06e0dc2a
https://doi.org/10.6028/nist.sp.1052

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Measurement Science for 'More-Than-Moore' Technology Reliability Assessments

Autor: Y. Obeng, Chukwudi Okoro, Joseph Kopanski

Publikováno v: ECS Meeting Abstracts. :2792-2792

not Available.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::4b28b6d5896ab49d3fcd2995579bcc02
https://doi.org/10.1149/ma2012-02/36/2792

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