Výsledky vyhledávání - "Joseph Favata"

Training AI-Based Feature Extraction Algorithms, for Micro CT Images, Using Synthesized Data

Autor: Pouya Tavousi, Matthew Konnik, Sina Shahbazmohamadi, Zahra Shahbazi, Joseph Favata, Bahar Ahmadi, Nicholas May

Publikováno v: Journal of Nondestructive Evaluation. 40

X-ray computed tomography (CT) is a powerful technique for non-destructive volumetric inspection of objects and is widely used for studying internal structures of a large variety of sample types. The raw data obtained through an X-ray CT practice is

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::7de24e2580b0a76f35e6e9a2d2dca8fc
https://doi.org/10.1007/s10921-021-00758-w

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Faster and More Efficient FIB Sample Preparation: Exploring Single-Raster Staircase Patterning at Glancing Angle of Incidence

Autor: Sina Shahbazmohamadi, Valery Ray, Joseph Favata

Publikováno v: International Symposium for Testing and Failure Analysis.

Focused Ion Beam sample preparation for electron microscopy often requires large volumes of material to be removed. Prior efforts to increase the rate of bulk material removal were mainly focused on increasing the primary ion beam current. Enhanced s

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::51c12d87b6881e77382e314cac770e5c
https://doi.org/10.31399/asm.cp.istfa2020p0150

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Correlative Microscopy-Based Approach for Analyzing Microscopic Impurities in Carbon Black for Lithium-Ion Battery Applications

Autor: Joseph Favata, Leonard J. Bonville, Jasna Jankovic, Sina Shahbazmohamadi, Abhinav Poozhikunnath, Radenka Maric, Jincheng Xiong, Bahar Ahmadi

Publikováno v: Journal of The Electrochemical Society. 166:A3335-A3341

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::65e855edbffb7803afd9b45f9ab09341
https://doi.org/10.1149/2.0761914jes

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A novel crowdsourcing platform for microelectronics counterfeit defect detection

Autor: Pouya Tavousi, Rengarajan Pelapur, Sina Shahbazmohamadi, Peiman Shahbeigi-Roodposhti, Joseph Favata, Bahar Ahmadi

Publikováno v: Microelectronics Reliability. :48-53

Disguising non-authentic electronic parts as otherwise, so called as electronic counterfeiting, continues to inflict significant damages on government, industry and society. This calls for finding effective ways to identify counterfeits. The current

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::911b849b24b085d96dfa123a9de5a316
https://doi.org/10.1016/j.microrel.2018.07.107

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Low Thermal Conductivity Yttrium Aluminum Garnet Thermal Barrier Coatings Made by the Solution Precursor Plasma Spray: Part I—Processing and Properties

Autor: Jeffery Roth, Joseph Favata, Drew Cietek, Rishi Kumar, Sina Shahbazmohamadi, Jiwen Wang, Maurice Gell, Chen Jiang, Eric H. Jordan

Publikováno v: Journal of Thermal Spray Technology. 27:781-793

Critical properties of TBCs include low thermal conductivity (TC) and high cyclic durability. In recent years, the solution precursor plasma spray (SPPS) process has been effectively used for deposition of TBCs with enhanced cyclic durability for ytt

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::95cf6e3a5f4675c13a3216419b7452bc
https://doi.org/10.1007/s11666-018-0728-9

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Realistic non-destructive testing of integrated circuit bond wiring using 3-D X-ray tomography, reverse engineering, and finite element analysis

Autor: Sina Shahbazmohamadi, Joseph Favata

Publikováno v: Microelectronics Reliability. 83:91-100

Within industries that manufacture and/or utilize semiconductor devices, integrated circuit (IC) bond wiring is tested for product assurance and counterfeit detection purposes through invasive and destructive probing. The examined unit is either part

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3f241c164db9ca3bb6be5287b36cf62b
https://doi.org/10.1016/j.microrel.2018.02.015

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Correlative microscopy workflow for precise targeted failure analysis of multi-layer ceramic capacitors

Autor: Pouya Tavousi, Joseph Favata, Nicholas May, Bahar Ahmadi, Sina Shahbazmohamadi

Publikováno v: Microelectronics Reliability. 114:113858

The correlative framework includes three-dimensional X-ray tomography, femto-second laser micro machining, three-dimensional FIB/SEM/EDS tomography, and data segmentation. This framework is highly efficient allowing non-destructive locating of the de

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::923ec0800f425ffc3b18538bf6b1aa5b
https://doi.org/10.1016/j.microrel.2020.113858

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