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pro vyhledávání: '"Josef Strnadel"'
Autor:
Josef Strnadel
Publikováno v:
2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS).
Autor:
Josef Strnadel
Publikováno v:
DDECS
Narrow timing margins in modern digital circuits result in delay defects that are difficult to detect. The probability that such a defect occurs increases with factors such as shrinking feature sizes, increasing process variations, operating frequenc
Autor:
Josef Strnadel
Publikováno v:
DATE
Many works have shown that approximate circuits may play an important role in the development of resource-efficient electronic systems. This motivates many researchers to propose new approaches for finding an optimal trade-off between the approximati
Autor:
Josef Strnadel
Publikováno v:
IEEE Design & Test. 35:57-63
This article proposes a model comprising of a network of stochastic timed automata for predictability analysis of interruptible systems via statistical model checking.
Autor:
Josef Strnadel
Publikováno v:
DATE
Ideally, the reliability can be assessed analytically, provided that an analytical solution exists and its presumptions are met. Otherwise, alternative approaches to the assessment must apply. This paper proposes a novel, simulation based approach th
Autor:
Josef Strnadel
Publikováno v:
DSD
The problem of dependability assessment can be solved analytically just under predefined conditions. If they do not hold, alternative approaches must apply. Widely, they rely on the Monte Carlo simulation, suffering by the high computational complexi
Autor:
Josef Strnadel
Publikováno v:
Leveraging Applications of Formal Methods, Verification and Validation: Foundational Techniques ISBN: 9783319471655
ISoLA (1)
ISoLA (1)
The paper presents a method for creation and analysis of reliability models by means of stochastic timed automata and statistical model checking approach available in the UPPAAL SMC tool; its application is expected in, but not limited to, the area o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::df5b113c5f29455466280e97cb36e5b5
https://doi.org/10.1007/978-3-319-47166-2_11
https://doi.org/10.1007/978-3-319-47166-2_11
Autor:
Josef Strnadel
Publikováno v:
ECBS-EERC
This paper is related to event-driven embedded systems whose function can be divided into the real-time (RT) and non-RT parts. Such a system must be designed so that all predetermined timing constraints are met at runtime, even in adverse conditions
Autor:
Josef Strnadel, František Slimařík
Publikováno v:
COMPUTING AND INFORMATICS; Vol 33, No 4 (2014): Computing and Informatics; 757-782
Real-time kernels are often utilized to simplify the design of embedded time/safety-critical applications. However, embedded systems are sensitive to transient and other faults, each of which can lead to various errors at various system levels and ca
Autor:
Josef Strnadel
Publikováno v:
IFAC Proceedings Volumes. 36:213-218
The existence of loops in a circuit structure causes problems in both test generation and application. Thus, the problem of identifying loops becomes an important task during testability analysis or, later, e.g., during allocation-for testability pro