Zobrazeno 1 - 10
of 35
pro vyhledávání: '"Jose Mustre de Leon"'
Autor:
Jose Mustre de Leon, Francisco J. Espinosa-Faller, Cesia Guarneros-Aguilar, Rafael Valentin Tolentino-Hernandez, Felipe Caballero-Briones, Roberto A. Colina-Ruiz
Publikováno v:
The Journal of Physical Chemistry C. 123:13918-13924
The local atomic structure of multilayer films of graphene oxide, cadmium sulfide, and cadmium sulfide–selenide was analyzed by X-ray absorption fine structure spectroscopy. The films were prepared...
Autor:
Christophe Moulin, Jose Mustre de Leon, Christophe Den Auwer, Roberto A. Colina-Ruiz, Pier Lorenzo Solari, Philippe Moisy, Marguerite Monfort, Maria Rosa Beccia, Thomas Dumas, Mireille Guigue, Minja Matara-aho
Publikováno v:
ChemistrySelect. 3:2021-2024
Autor:
M. Janeth Lozano-Rodriguez, Pierre Thuéry, Sébastien Petit, Roy Copping, Jose Mustre de Leon, Christophe Den Auwer
Publikováno v:
Acta Crystallographica Section E, Vol 67, Iss 4, Pp m487-m487 (2011)
The title compound, (C16H36N)3[Th(NCS)4(NO3)3], was obtained from the reaction of Th(NO3)4·5H2O with (Bu4N)(NCS). The ThIV atom is in a ten-coordinate environment of irregular geometry, being bound to the N atoms of the four thiocyanate ions and to
Externí odkaz:
https://doaj.org/article/81a4d640568b4b5f822c8f21375bd182
Autor:
Juan A. Hoy-Benítez, Juan S. Lezama-Pacheco, Roberto A. Colina-Ruiz, Jose Mustre de Leon, Francisco J. Espinosa-Faller
Publikováno v:
Journal of Alloys and Compounds. 854:157258
The local atomic structure of Zn1-xNixS thin films was investigated using X-ray absorption spectroscopy. The films were grown using RF-sputtering at atomic concentrations x = 0.00, x = 0.04, x = 0.08 and x = 0.14. X-ray diffraction shows that the lat
Autor:
Jose Mustre de Leon
Publikováno v:
High-Tc Copper Oxide Superconductors and Related Novel Materials ISBN: 9783319526744
We present an overview of local dynamical lattice distortions in cuprates in the pseudogap region of the phase diagram. These distortions are present in all cuprate superconductors and involve both copper-oxygen in plane and out of planes bonds. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::efaffcbc41a51647e96637a57c30521d
https://doi.org/10.1007/978-3-319-52675-1_17
https://doi.org/10.1007/978-3-319-52675-1_17
Autor:
Roberto A. Colina-Ruiz, Juan A. Hoy-Benítez, Jose Mustre de Leon, Francisco J. Espinosa-Faller, Juan S. Lezama-Pacheco
Publikováno v:
Materials Letters. 257:126774
V K-edge X-ray absorption near edge structure spectroscopy analysis of Zn1-xVxS shows that the bulk V valence states change from V(IV) to V(II) as the V concentration increases from x = 0.15 to x = 0.48. Atomic bound-state transitions from the hybrid
Autor:
Iván Ortega-Blake, M. Cristina Vargas, Jorge Hernández-Cobos, Amelie Leclercq, Christophe Den Auwer, P. L. Solari, Jose Mustre de Leon, Juan S. Lezama-Pacheco, Jesús Canche-Tello
Publikováno v:
The journal of physical chemistry. A. 119(12)
We performed near edge X-ray absorption spectroscopy (XANES) measurements on the arsenic K-edge of As(III) in solution under acidic and basic conditions, after exposure of the solutions to air. Spectra were recorded for increasing exposure times to t
Autor:
Jesús Canche-Tello, Christophe Den Auwer, Jorge Hernández-Cobos, Iván Ortega-Blake, M. Cristina Vargas, Amelie Leclercq, P. L. Solari, Jose Mustre de Leon
Publikováno v:
The journal of physical chemistry. A. 118(46)
We performed X-ray absorption spectroscopy measurements on the arsenic K-edge of As(III) in solution under acidic conditions. Extended X-ray absorption fine structure (EXAFS) and X-ray near edge structure (XANES) spectra were compared with theoretica
Autor:
Eric Simoni, André Béres, Philippe Moisy, Jose Mustre de Leon, Christophe Den Auwer, Steven D. Conradson
Publikováno v:
Comptes Rendus de l'Académie des Sciences - Series IIC - Chemistry. 3:327-333
X-ray absorption spectroscopy is used to probe the electronic and structural features of the actinides. To better understand the effect of the effective charge and polyhedron on the edge structure, we discuss the L III and M V edges in AnO 2 (NO 3 )
Autor:
Gerald T. Seidler, Antoinette J. Taylor, Trevor A. Tyson, Yong Q. An, Juan S. Lezama-Pacheco, Darrin D. Byler, Anna Llobet, Tomasz Durakiewicz, Jose Mustre de Leon, Nancy J. Hess, Alison L. Costello, Stuart A. Trugman, Francisco J. Espinosa-Faller, Kevin S. Boland, David A. Andersson, Dylan R. Conradson, David Clark, Dennis Nordlund, George Rodriguez, J. A. Bradley, Thomas Proffen, Steven D. Conradson, Leilani L. Conradson, Mary B. Martucci, Daniel E. Schwarz, James A. Valdez, Alan R. Bishop, Gerard H. Lander
Publikováno v:
Physical Review B. 88
X-ray pair distribution function (pdf) and U L${}_{3}$ extended x-ray absorption fine structure (EXAFS) and neutron pdf measurements that give identical results for UO${}_{2}$ show U(VI)-oxo moieties with x rays for mixed valence U${}_{4}$O${}_{9}$ a