Zobrazeno 1 - 10
of 143
pro vyhledávání: '"Jose E. Rayas-Sanchez"'
Publikováno v:
IEEE Journal of Microwaves, Vol 1, Iss 1, Pp 481-493 (2021)
In this paper, we outline the historical evolution of RF and microwave design optimization and envisage imminent and future challenges that will be addressed by the next generation of optimization developments. Our journey starts in the 1960s, with t
Externí odkaz:
https://doaj.org/article/f13556cafdf34b738fb615dbba4f542d
Autor:
Edgar A. Vega-Ochoa, Johana L. Silva-Cortes, Ricardo Baca-Baylon, Francisco E. Rangel-Patino, Jose E. Rayas-Sanchez, Andres Viveros-Wacher
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility. 64:516-523
Post-silicon electrical validation of high-speed input/output (HSIO) links is a critical process for product qualification schedules of high-performance computer platforms under current aggressive time-to-market commitments. Improvements in signaling
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3705d01507a1f461fc4f70116390fecb
https://doi.org/10.1109/temc.2021.3122348
https://doi.org/10.1109/temc.2021.3122348
Autor:
Jose E. Rayas-Sanchez, John W. Bandler
Publikováno v:
2022 52nd European Microwave Conference (EuMC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8fbda8b5a89e1693473d70ebb25451a3
https://doi.org/10.23919/eumc54642.2022.9991871
https://doi.org/10.23919/eumc54642.2022.9991871
Autor:
Jose E. Rayas-Sanchez, John W. Bandler
Publikováno v:
2022 IEEE/MTT-S International Microwave Symposium - IMS 2022.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c145d3752f6efcfdce748282ac4b7aa
https://doi.org/10.1109/ims37962.2022.9865412
https://doi.org/10.1109/ims37962.2022.9865412
Publikováno v:
2022 IEEE/MTT-S International Microwave Symposium - IMS 2022.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::daecd114bc83554c6d2abf91056f14fe
https://doi.org/10.1109/ims37962.2022.9865578
https://doi.org/10.1109/ims37962.2022.9865578
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility. 62:2528-2537
As microprocessor architectures continue to increase computing performance under low-energy consumption, the combination of signal integrity, electromagnetic interference, and power delivery (PD) is becoming crucial in the computer industry. In that
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::22685adeff55ccc8fd685753f2a7eaf7
https://doi.org/10.1109/temc.2020.2973946
https://doi.org/10.1109/temc.2020.2973946
Autor:
Ismael Duron-Rosales, Nagib Hakim, Edgar A. Vega-Ochoa, Francisco E. Rangel-Patino, Jose E. Rayas-Sanchez, Andres Viveros-Wacher, Enrique Lopez-Miralrio
Publikováno v:
IEEE Transactions on Emerging Topics in Computing. 8:453-463
There is an increasingly higher number of mixed-signal circuits within microprocessors and systems on chip (SoC). A significant portion of them corresponds to high-speed input/output (HSIO) links. Post-silicon validation of HSIO links can be critical
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c8df6bf2d11a109811d91d50e1b23477
https://doi.org/10.1109/tetc.2017.2757937
https://doi.org/10.1109/tetc.2017.2757937
Publikováno v:
IEEE Microwave Magazine. 21:114-118
The second edition of the IEEE MTT-S Latin America Microwave Conference (LAMC) was carried out in Arequipa, Peru, the second week of December 2018. After the official approval of LAMC in 2015 as a biannual MTT-S conference, there were several strateg
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::07d5fb03cdc48ff3c1611d44d1ed84a0
https://doi.org/10.1109/mmm.2019.2945217
https://doi.org/10.1109/mmm.2019.2945217
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 67:2143-2150
The demand and relevance of efficient analog fault diagnosis methods for modern RF and microwave-integrated circuits increase with the growing need and complexity of analog and mixed-signal circuitry. The well-established digital fault diagnosis meth
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4cb947d705850f1f16e1ac28ce3bd1b
https://doi.org/10.1109/tmtt.2019.2914106
https://doi.org/10.1109/tmtt.2019.2914106
Autor:
Francisco E. Rangel-Patino, Edgar A. Vega-Ochoa, Nagib Hakim, Jose L. Chavez-Hurtado, Jose E. Rayas-Sanchez, Andres Viveros-Wacher
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 38:733-740
As microprocessor design scales to the 10-nm technology and beyond, traditional pre- and post-silicon validation techniques are unsuitable to get a full system functional coverage. Physical complexity and extreme technology process variations severel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0355fa0d9a6ea4457f2bccfb0d9a5070
https://doi.org/10.1109/tcad.2018.2834403
https://doi.org/10.1109/tcad.2018.2834403